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题名: A Fully Affine Invariant Feature Detector
作者: Li W(李威) ; Shi ZL(史泽林) ; Yin J(尹健)
作者部门: 光电信息技术研究室
会议名称: 21st International Conference on Pattern Recognition (ICPR 2012)
会议日期: November 11-15, 2012
会议地点: Tsukuba, Japan
会议主办者: The International Association for Pattern Recognition
会议录出版者: IAPR
出版日期: 2012
页码: 2768-2771
收录类别: EI
ISBN号: 978-4-9906441-1-6
摘要: This paper proposes a Fully Affine Invariant Feature (FAIF) detector which is based on affine Gaussian scale-space. The covariance matrix of Maximally Stable Extremal Region is interpreted as an isotropy measure of an image patch. A local anisotropic image patch can be supposed as an affine transformed isotropic image patch. Therefore, the affine deformation of a MSER can be estimated by its covariance matrix. According to affine Gaussian scale-space theory, filters must be compatible with local image structures. An anisotropic image patch should be smoothed by an elliptical Gaussian filter which is difficult to be constructed directly. In order to use circular Gaussian filters, FAIF transforms affine Gaussian scale-space into scale space by the way that rotating and compressing an anisotropic image region into an isotropic one. The fully affine invariant features are detected on isotropic image patches by Scale Invariant Feature Transform (SIFT) algorithm. Experimental results show that FAIF has much more matches than the state-of-the-art algorithms.
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内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/10171
Appears in Collections:光电信息技术研究室_会议论文

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Recommended Citation:
李威; 史泽林; 尹健.A Fully Affine Invariant Feature Detector.见:IAPR.,,2012,2768-2771
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文件名: A Fully Affine Invariant Feature Detector.pdf
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