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A Fully Affine Invariant Feature Detector
Li W(李威); Shi ZL(史泽林); Yin J(尹健)
作者部门光电信息技术研究室
会议名称21st International Conference on Pattern Recognition (ICPR 2012)
会议日期November 11-15, 2012
会议地点Tsukuba, Japan
会议主办者The International Association for Pattern Recognition
出版者IAPR
2012
页码2768-2771
收录类别EI
EI收录号20131016092188
产权排序1
ISBN号978-4-9906441-1-6
摘要This paper proposes a Fully Affine Invariant Feature (FAIF) detector which is based on affine Gaussian scale-space. The covariance matrix of Maximally Stable Extremal Region is interpreted as an isotropy measure of an image patch. A local anisotropic image patch can be supposed as an affine transformed isotropic image patch. Therefore, the affine deformation of a MSER can be estimated by its covariance matrix. According to affine Gaussian scale-space theory, filters must be compatible with local image structures. An anisotropic image patch should be smoothed by an elliptical Gaussian filter which is difficult to be constructed directly. In order to use circular Gaussian filters, FAIF transforms affine Gaussian scale-space into scale space by the way that rotating and compressing an anisotropic image region into an isotropic one. The fully affine invariant features are detected on isotropic image patches by Scale Invariant Feature Transform (SIFT) algorithm. Experimental results show that FAIF has much more matches than the state-of-the-art algorithms.
语种英语
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/10171
专题光电信息技术研究室
通讯作者Li W(李威)
作者单位1.Graduate University of Chinese Academy of Sciences, Beijing, 100049, China
2.Shenyang Institute of, Automation Chinese Academy of Sciences Shenyang, Shenyang 110016, China
3.Research Institute on General Development of Air Force, Beijing, 100076, China
推荐引用方式
GB/T 7714
Li W,Shi ZL,Yin J. A Fully Affine Invariant Feature Detector[C]//The International Association for Pattern Recognition:IAPR,2012:2768-2771.
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