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A novel method to assess the effect of diversity on Common Cause Failure mitigation
Wang K(王锴); Xu AD(徐皑冬); Wang H(王宏); Liu J(刘捷); Song Y(宋岩)
作者部门工业控制网络与系统研究室
会议名称2013 IEEE International Conference on Industrial Technology, ICIT 2013
会议日期February 25-28, 2013
会议地点Cape Town, South africa
会议主办者The Institute of Electrical and Electronics Engineers (IEEE); IEEE Industrial Electronics Society (IES); IEEE Technology Management Council; IEEE Region 8; IEEE South Africa Section IE/IA/PEL Joint Chapter
会议录名称Proceedings of the IEEE International Conference on Industrial Technology
出版者IEEE
出版地Piscataway, NJ
2013
页码1204-1209
收录类别EI ; CPCI(ISTP)
EI收录号20132016335184
WOS记录号WOS:000322785200188
产权排序1
ISBN号978-14673-4569-9
关键词Common Cause Failure Component Degradation Diversity Impact Factor Impact Vectors
摘要Redundancy techniques are widely used to design fault tolerant systems. Diversity has long been used to protect redundant systems from Common Cause Failure (CCF). Whilst there is clear evidence that diversity can bring benefits, these benefits can be difficult to quantify. Therefore, a novel method which researches the effect of diversity on CCF mitigation from the component degradation state point of view is proposed in this paper. Four categories of impact factors (IFs), which influence the failure behavior of the component, are defined and the corresponding method of mapping diversity into component degradation valve (CDV) has been proposed aiming at the characteristics of each IF category. Then CCF analysis is performed based on weighted impact vectors which can be calculated from CDVs. Due to related reliability data has been collected for each IF category the method has a good applying prospect. An illustrative case study is presented, which shows the application process of the novel method.
语种英语
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/12419
专题工业控制网络与系统研究室
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Wang K,Xu AD,Wang H,et al. A novel method to assess the effect of diversity on Common Cause Failure mitigation[C]//The Institute of Electrical and Electronics Engineers (IEEE); IEEE Industrial Electronics Society (IES); IEEE Technology Management Council; IEEE Region 8; IEEE South Africa Section IE/IA/PEL Joint Chapter. Piscataway, NJ:IEEE,2013:1204-1209.
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