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Alternative TitleMethod for correcting plasma emission spectral line self-absorption effect
于海斌; 孙兰香; 杨志家; 郭前进; 辛勇; 丛智博
Rights Holder中国科学院沈阳自动化研究所
Patent Agent沈阳科苑专利商标代理有限公司 21002
Other AbstractThe invention discloses a method for correcting plasma emission spectral line self-absorption effect. Based on an internal reference line, the intensity of the plasma emission spectral line after correction is obtained through calculating spectral line self-absorption correction coefficient. The specific steps are: 1) one plasma emission spectral line with self-absorption correction coefficient of one in the plasma emission spectral lines of elements to be analyzed is selected as the internal reference line 2) the plasma temperature T of the elements to be analyzed is calculated 3) the spectral line self-absorption correction coefficient of an analytical line is calculated through a self-absorption correction coefficient calculation formula 4) the intensity of the spectral line of the analytical line is corrected according to the self-absorption correction coefficient of the analytical line and 5) the steps are repeated, the intensity of the spectral line is cyclically corrected, the corrected intensity of the plasma emission spectral line is finally obtained when the self-absorption correction coefficient of the analytical line reaches the preset accuracy, and the correction of the self-absorption effect is completed. By adopting the method, the invention has the advantages that the plasma temperature is calculated more accurately and the quantitative analysis of the material compositions is conducted more accurately.
PCT Attributes
Application Date2008-12-12
Date Available2012-05-23
Application NumberCN200810229661.6
Open (Notice) NumberCN101750404A
Contribution Rank1
Document Type专利
Recommended Citation
GB/T 7714
于海斌,孙兰香,杨志家,等. 校正等离子体发射谱线自吸收效应的方法[P]. 2010-06-23.
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