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专利名称: 表面缺陷检测方法、装置
其他题名: Method and apparatus for testing surface defect
作者: 邬纪泽; 李伟; 沈大刚
所属部门: 自动化系统研究室
专利权人: 广州中国科学院工业技术研究院 ; 中国科学院沈阳自动化研究所
专利代理: 广州华进联合专利商标代理有限公司
专利国别: 中国
专利类型: 发明
专利状态: 有效
摘要: 本发明涉及检测领域,公开了一种表面缺陷检测方法、装置,方法包括:获取表面的原始图像;对原始图像的各像素点,分别计算每像素点在多个方向的梯度值,取其中最大值作为像素点的新的灰度值,得到梯度图像;对梯度图像,如果灰度值像素点的灰度值大于阈值,则将其灰度值赋值为:第一灰度值,否则赋值为:第二灰度值,获取二值化图像;细化二值化图像,得到单线条的二值化图像,其中包括单线条的缺陷边缘;将单线条的缺陷边缘,转换为闭环的缺陷边缘;在原始图像中,比较闭环的缺陷边缘内像素点与外侧附近的像素点的灰度值的大小,如果小于,则判定闭环的缺陷为:表面的缺陷。应用本技术方案能够实现对被检测物件的缺陷的自动检测,提高检测效率。
英文摘要: The invention relates to the testing field, which discloses a method and a device of surface detection of defect, the method includes the following steps: acquiring an original surface image calculating gradient values of every pixel point of the original image along multiple directions respectively, taking a maximum value therein as a new gray value of the pixel point, obtaining a gradient image if the gray value of the gray value pixel point is greater than the threshold value, then the gray value is evaluated as: the first gray value, otherwise is evaluated as: the second gray value, obtaining a binary image refining the binary image, obtaining a single wired binary image, wherein, the single wired defective edge is included converting the single wired defective edge into a close looped defective edge in the original image, comparing the gray values between the pixel point in the close looped defective edge and the pixel point nearby the outside, if less than, the defect of theclose loop is judged as surface defect. Using the technical scheme can achieve the automatic detection of defects in the tested object, which improves the testing efficiency.
是否PCT专利:
申请日期: 2008-03-26
公开日期: 2008-09-03
授权日期: 2010-06-02
专利申请号: CN200810027040.X
公布/公告号: CN101256157
语种: 中文
产权排序: 2
内容类型: 专利
URI标识: http://ir.sia.cn/handle/173321/13173
Appears in Collections:自动化系统研究室_专利

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文件名: CN200810027040.X.pdf
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文件名: CN200810027040.X授权.pdf
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