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A line mapping based automatic registration algorithm of infrared and visible images
Ai R(艾锐); Shi ZL(史泽林); Xu DJ(徐德江); Zhang CS(张程硕)
作者部门光电信息技术研究室
会议名称5th International Symposium on Photoelectronic Detection and Imaging (ISPDI) - Infrared Imaging and Applications
会议日期June 25-27, 2013
会议地点Beijing
会议主办者Chinese Soc Astronaut, Photoelectron Technol Comm, Tianjin Jinhang Inst Tech Phys, Sci & Technol Low Light Level Night Vis Lab, Sci & Technol Opt Radiat Lab, Sci & Technol Electromagnet Scattering Lab, SPIE, Opt Soc, European Opt Soc, Chinese Soc Astronaut
会议录名称INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2013: INFRARED IMAGING AND APPLICATIONS
出版者SPIE-INT SOC OPTICAL ENGINEERING
出版地BELLINGHAM
2013
页码1-9
收录类别EI ; CPCI(ISTP)
EI收录号20141317510147
WOS记录号WOS:000325423700080
产权排序1
ISSN号0277-786X
ISBN号978-0-8194-9776-5
关键词There ExIst Complex Gray MappIng Relationships Among Infrared And VIsible Images Because Of The Different ImagIng MechanIsms. The Difficulty Of Infrared And VIsible Image RegIstration Is To FInd a Reasonable Similarity DefInition. In thIs Paper We Develop a Novel Image Similarity Called Implicit Linesegment Similarity(Ils) And a RegistratiOn Algorithm Of Infrared And Visible Images Based On Ils. Essentially The Algorithm Achieves Image Registration By AlignIng The CorrespondIng LIne Segment Features In Two Images. First We Extract LIne Segment Features And Record Their CoordInate Positions In One Of The Images And Map These LIne Segments InTo The SecOnd Image Based On The Geometric transFormatiOn Model. Then We Iteratively Maximize The Degree Of Similarity betWeen The LIne Segment Features And correspOndence regiOns In The SecOnd Image To obtaIn The Model.Parameters. The Advantage Of doIng ThIs Is No Need Directly measurIng The Gray Similarity betWeen The Two Images. We Adopt a multi-resolutiOn analysIs Method To Calculate The Model.Parameters.From Coarse To fIne On Gaussian Scale Space. The Geometric transFormatiOn Parameters.Are fInally obtaIned By The Improved poWell Algorithm. Comparative Experiments demOnstrate That The Proposed Algorithm.Can Effectively Achieve The auTomatic regIstratiOn For InfrAred And vIsible Images And Under COnsiderable Accuracy It Makes a More Significant Improvement On computatiOnal Efficiency And Anti-noise abilIty Than Previously Proposed algorIthms.
语种英语
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文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/13844
专题光电信息技术研究室
通讯作者Ai R(艾锐)
作者单位1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.University of Chinese Academy of Sciences, Beijing 100049, China
3.Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Science, Shenyang 110016, China
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Ai R,Shi ZL,Xu DJ,et al. A line mapping based automatic registration algorithm of infrared and visible images[C]//Chinese Soc Astronaut, Photoelectron Technol Comm, Tianjin Jinhang Inst Tech Phys, Sci & Technol Low Light Level Night Vis Lab, Sci & Technol Opt Radiat Lab, Sci & Technol Electromagnet Scattering Lab, SPIE, Opt Soc, European Opt Soc, Chinese Soc Astronaut. BELLINGHAM:SPIE-INT SOC OPTICAL ENGINEERING,2013:1-9.
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