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Efficient Imaging and Real-time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing
Li GX(李恭新); Li P(李鹏); Wang YC(王越超); Wang WX(王文学); Xi N(席宁); Liu LQ(刘连庆)
Department机器人学研究室
Conference Name3rd International Conference on Manipulation, Manu­facturing and Measurement on the Nanoscale, 3M-NANO 2013
Conference DateAugust 26-30, 2013
Conference PlaceSuzhou, China
Source Publication3rd International Conference on Manipulation, Manu­facturing and Measurement on the Nanoscale, 3M-NANO 2013
PublisherIEEE
Publication PlaceNEW YORK
2013
Pages114-118
Indexed ByEI ; CPCI(ISTP)
EI Accession number20141217470598
WOS IDWOS:000350808700024
Contribution Rank1
ISBN978-1-4799-1210-0
KeywordScanning Ion Conductance Microscopy (Sicm) Compressive Sensing (Cs) Blocks Compressive Sensing
AbstractScanning Ion Conductance Microscopy (SICM) is one kind of Scanning Probe Microscopies (SPMs), and it can be used in mapping topographical features of sample at high -resolution with free contact by measuring the ion current of ultra-micropipette. SICM is widely used in imaging soft samples for many distinct merits, such as high resolution imaging, simple preparation of probe and no harm to sample surface. However, it is undeniable that the scanning speed of SICM is much slower than other SPMs, especially for large scale and high resolution imaging. Fortunately, compressive sensing (CS), which breaks through the Shannon’s sampling theorem for dramatically reducing sample rate, could improve scanning speed tremendously, but it still costs much time in image reconstruction. Therefore block compressive sensing was applied to SICM imaging for reducing the reconstruction time of sparse signals, and it has an anther further and unique application that it can achieve the function of image real-time display. In this paper, a new method of dividing blocks and a new matrix arithmetic operation was proposed to build the block compressive sensing model, and several experiments was taken to verified the superiority of block compressive sensing in reducing imaging time and image real-time display used SICM.
Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/13908
Collection机器人学研究室
Corresponding AuthorWang WX(王文学); Liu LQ(刘连庆)
Affiliation1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China
2.University of Chinese Academy of Sciences China, Beijing, 100049, China
3.Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, United States
Recommended Citation
GB/T 7714
Li GX,Li P,Wang YC,et al. Efficient Imaging and Real-time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing[C]. NEW YORK:IEEE,2013:114-118.
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