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Reconstruction of an AFM image based on estimation of the tip shape
Yuan S(袁帅); Luan FJ(栾方军); Song, Xiaoyu; Liu LQ(刘连庆); Liu, Jifei
作者部门机器人学研究室
关键词Afm Tip Model Blind Tip Estimation Algorithm Image Reconstruction
发表期刊MEASUREMENT SCIENCE & TECHNOLOGY
ISSN0957-0233
2013
卷号24期号:10
收录类别SCI ; EI
EI收录号20134116823188
WOS记录号WOS:000324621900038
产权排序1
资助机构This research work is partially supported by the National Natural Youth Science Foundation of China (Project Codes: 61305125), the National Natural Science Foundation of China (Project Codes: 60904095, 61175103), the Youth Natural Science Foundation of University (Project Codes: 2012045) and National Post Doctor Foundation (Project Codes: 2013M530955). The authors thank the support of Institute of Metal Research, Chinese Academy of Sciences.
摘要From the viewpoint of mathematical morphology, an atomic force microscopy (AFM) image contains the distortion effect of the tip convolution on a real sample surface. If tip shape can be characterized accurately, mathematical deconvolution can be applied to reduce the distortion to obtain more precise AFM images. AFM image reconstruction has practical significance in nanoscale observation and manipulation technology. Among recent tip modeling algorithms, the blind tip evaluation algorithm based on mathematical morphology is widely used. However, it takes considerable computing time, and the noise threshold is hard to optimize. To tackle these problems, a new blind modeling method is proposed in this paper to accelerate the computation of the algorithm and realize the optimum threshold estimation to build a precise tip model. The simulation verifies the efficiency of the new algorithm by comparing the computing time with the original one. The calculated tip shape is also validated by comparison with the SEM image of the tip. Finally, the reconstruction of a carbon nanotube image based on the precise tip model illustrates the feasibility and validity of the proposed algorithm.
语种英语
WOS标题词Science & Technology ; Technology
WOS类目Engineering, Multidisciplinary ; Instruments & Instrumentation
关键词[WOS]SCANNED PROBE MICROSCOPY ; NANOSCALE ; GEOMETRY
WOS研究方向Engineering ; Instruments & Instrumentation
引用统计
被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.sia.cn/handle/173321/14068
专题机器人学研究室
通讯作者Yuan S(袁帅)
作者单位1.Information and Control Engineering Faculty, Shenyang Jianzhu University, Shenyang 110168, China
2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
3.Graduate University of the Chinese Academy of Sciences, Beijing 100039, China
推荐引用方式
GB/T 7714
Yuan S,Luan FJ,Song, Xiaoyu,et al. Reconstruction of an AFM image based on estimation of the tip shape[J]. MEASUREMENT SCIENCE & TECHNOLOGY,2013,24(10).
APA Yuan S,Luan FJ,Song, Xiaoyu,Liu LQ,&Liu, Jifei.(2013).Reconstruction of an AFM image based on estimation of the tip shape.MEASUREMENT SCIENCE & TECHNOLOGY,24(10).
MLA Yuan S,et al."Reconstruction of an AFM image based on estimation of the tip shape".MEASUREMENT SCIENCE & TECHNOLOGY 24.10(2013).
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