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Alternative TitleSemiconductor encapsulation testing fine feeding control method based on constrained minimum spanning tree
张国辉; 刘昶; 陈海赞; 姚丽丽; 史海波
Rights Holder无锡中科泛在信息技术研发中心有限公司 ; 中国科学院沈阳自动化研究所
Patent Agent无锡市大为专利商标事务所 32104
Other AbstractSemiconductor encapsulation testing production belongs to a processing process with high flow process complexity and high fund density, relative to other manufacturing industries, the semiconductor encapsulation testing production is characterized in that the product types are various, the work procedure is complicated, and the utilization rate requirement on equipment is higher, so the fine feeding control plays an important role in improving the utilization rate of production system bottleneck equipment. By aiming at the bottleneck equipment, a problem to be solved is modeled as a problem for solving a constrained minimum spanning tree, and the constrained minimum spanning tree is obtained, so the specific feeding sequence and the specific feeding time of each product are obtained. The method solves the bottleneck problem caused by blind feeding, and finally, the effectiveness and the superiority of the method are verified through application research. The provided method has the advantages that the machine modification cost can be reduced, the production period is shortened, and the production benefit is improved.
PCT Attributes
Application Date2013-07-31
Date Available2015-10-28
Application NumberCN201310330836.3
Open (Notice) NumberCN103399549A
Contribution Rank1
Document Type专利
Recommended Citation
GB/T 7714
张国辉,刘昶,陈海赞,等. 基于有约束的最小生成树的半导体封装测试细日投料控制方法[P]. 2013-11-20.
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File name: CN201310330836.3.pdf
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File name: CN201310330836.3授权.pdf
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