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The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode
Zhao ZX(赵增旭); Tian XJ(田孝军); Liu J(刘杰); Dong ZL(董再励); Liu LQ(刘连庆)
作者部门机器人学研究室
关键词Electrical Properties Of Cnt Efm Lift-up Height Of Probe Phase Response
发表期刊CHINESE SCIENCE BULLETIN
ISSN1001-6538
2014
卷号59期号:14页码:1591-1596
收录类别SCI
WOS记录号WOS:000335392000015
产权排序1
摘要Nowadays, one of the bottlenecks which hinder the development and application of carbon nanotube (CNT) nano device is that no pure semiconducting CNT (s-CNT) or metallic CNT (m-CNT) can be obtained, and for solving this problem scientists proposed some methods on preparation or separation, but all the results still should be detected and feedback to the process for further improving the preparation and separation methods. Thus, it is very important to measure and distinguish the electrical properties of CNT. For that, scientists proposed a method to measure CNT electrical properties based on DC electrostatic force microscope (EFM) mode, which distinguishes m-CNT from s-CNT according to different scan line shape to CNT with different electrical properties. But, we discovered that the probe lift-up height will seriously affect the shape of the scan line, which makes this method not reliable in distinguishing m-CNT from s-CNT. In this paper, the authors deeply researched the influence of probe lift-up height and also gave corresponding theoretical analysis and explanation, which will greatly improve the method of detecting CNT electrical properties by EFM.
语种英语
WOS类目Multidisciplinary Sciences
关键词[WOS]WALLED CARBON NANOTUBES ; SEPARATION ; GROWTH
WOS研究方向Science & Technology - Other Topics
引用统计
文献类型期刊论文
条目标识符http://ir.sia.cn/handle/173321/14756
专题机器人学研究室
通讯作者Tian XJ(田孝军)
作者单位1.State Key Laboratory of Robotics, Shenyang Institute of Automation (SIA)Chinese Academy of Sciences, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Zhao ZX,Tian XJ,Liu J,et al. The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode[J]. CHINESE SCIENCE BULLETIN,2014,59(14):1591-1596.
APA Zhao ZX,Tian XJ,Liu J,Dong ZL,&Liu LQ.(2014).The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode.CHINESE SCIENCE BULLETIN,59(14),1591-1596.
MLA Zhao ZX,et al."The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode".CHINESE SCIENCE BULLETIN 59.14(2014):1591-1596.
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