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题名: The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode
作者: Zhao ZX(赵增旭); Tian XJ(田孝军); Liu J(刘杰); Dong ZL(董再励); Liu LQ(刘连庆)
作者部门: 机器人学研究室
关键词: Electrical properties of CNT ; EFM ; Lift-up height of probe ; Phase response
刊名: CHINESE SCIENCE BULLETIN
ISSN号: 1001-6538
出版日期: 2014
卷号: 59, 期号:14, 页码:1591-1596
收录类别: SCI
产权排序: 1
摘要: Nowadays, one of the bottlenecks which hinder the development and application of carbon nanotube (CNT) nano device is that no pure semiconducting CNT (s-CNT) or metallic CNT (m-CNT) can be obtained, and for solving this problem scientists proposed some methods on preparation or separation, but all the results still should be detected and feedback to the process for further improving the preparation and separation methods. Thus, it is very important to measure and distinguish the electrical properties of CNT. For that, scientists proposed a method to measure CNT electrical properties based on DC electrostatic force microscope (EFM) mode, which distinguishes m-CNT from s-CNT according to different scan line shape to CNT with different electrical properties. But, we discovered that the probe lift-up height will seriously affect the shape of the scan line, which makes this method not reliable in distinguishing m-CNT from s-CNT. In this paper, the authors deeply researched the influence of probe lift-up height and also gave corresponding theoretical analysis and explanation, which will greatly improve the method of detecting CNT electrical properties by EFM.
语种: 英语
WOS记录号: WOS:000335392000015
类目[WOS]: Multidisciplinary Sciences
关键词[WOS]: WALLED CARBON NANOTUBES ; SEPARATION ; GROWTH
研究领域[WOS]: Science & Technology - Other Topics
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内容类型: 期刊论文
URI标识: http://ir.sia.cn/handle/173321/14756
Appears in Collections:机器人学研究室_期刊论文

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