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The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode
Zhao ZX(赵增旭); Tian XJ(田孝军); Liu J(刘杰); Dong ZL(董再励); Liu LQ(刘连庆)
Department机器人学研究室
Source PublicationCHINESE SCIENCE BULLETIN
ISSN1001-6538
2014
Volume59Issue:14Pages:1591-1596
Indexed BySCI
WOS IDWOS:000335392000015
Contribution Rank1
KeywordElectrical Properties Of Cnt Efm Lift-up Height Of Probe Phase Response
AbstractNowadays, one of the bottlenecks which hinder the development and application of carbon nanotube (CNT) nano device is that no pure semiconducting CNT (s-CNT) or metallic CNT (m-CNT) can be obtained, and for solving this problem scientists proposed some methods on preparation or separation, but all the results still should be detected and feedback to the process for further improving the preparation and separation methods. Thus, it is very important to measure and distinguish the electrical properties of CNT. For that, scientists proposed a method to measure CNT electrical properties based on DC electrostatic force microscope (EFM) mode, which distinguishes m-CNT from s-CNT according to different scan line shape to CNT with different electrical properties. But, we discovered that the probe lift-up height will seriously affect the shape of the scan line, which makes this method not reliable in distinguishing m-CNT from s-CNT. In this paper, the authors deeply researched the influence of probe lift-up height and also gave corresponding theoretical analysis and explanation, which will greatly improve the method of detecting CNT electrical properties by EFM.
Language英语
WOS SubjectMultidisciplinary Sciences
WOS KeywordWALLED CARBON NANOTUBES ; SEPARATION ; GROWTH
WOS Research AreaScience & Technology - Other Topics
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Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/14756
Collection机器人学研究室
Corresponding AuthorTian XJ(田孝军)
Affiliation1.State Key Laboratory of Robotics, Shenyang Institute of Automation (SIA)Chinese Academy of Sciences, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
Recommended Citation
GB/T 7714
Zhao ZX,Tian XJ,Liu J,et al. The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode[J]. CHINESE SCIENCE BULLETIN,2014,59(14):1591-1596.
APA Zhao ZX,Tian XJ,Liu J,Dong ZL,&Liu LQ.(2014).The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode.CHINESE SCIENCE BULLETIN,59(14),1591-1596.
MLA Zhao ZX,et al."The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode".CHINESE SCIENCE BULLETIN 59.14(2014):1591-1596.
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