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Research on the key diagnosis technology of PROFIBUS-DP based on FPGA
Jiao P(焦平); Zhou D(周侗); Liu, Wenjia
作者部门工业控制网络与系统研究室
会议名称2014 International Conference on Mechatronics and Intelligent Materials, MIM 2014
会议日期May 18, 2014 - May 19, 2014
会议地点Lijiang, China
会议主办者CEIS; IFST; National Chin-Yi University of Technology; Scientific.Net
会议录名称Advanced Materials Research
出版者Trans Tech Publications Ltd
出版地Zurich-Durnten, Switzerland
2014
页码1743-1746
收录类别EI
EI收录号20142917962115
产权排序1
ISSN号1022-6680
ISBN号978-3-03835-141-2
关键词Materials Materials Science
摘要This paper analyzes the characteristics of physical layer signals, communication protocols, and the timing of PROFIBUS-DP, at last proposed a kind key technologies diagnosis scheme of PROFIBUS-DP, which based on FPGA. The scheme requires only a few peripheral circuits and use of the FPGA logic synthesis external signal, can be completed in two-way isolation of the physical layer status of DP, data flow direction, baud rate detection and other functions, which can be applied to diagnosis failure of PROFIBUS-DP. © (2014) Trans Tech Publications, Switzerland.
语种英语
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/15148
专题工业控制网络与系统研究室
作者单位1.Shenyang Institute of Automation (SIA), Chinese Academy of Sciences China, Shenyang Lab. of Networked Control Systems, China
2.Shenyang King Career Technology Co.,Ltd, China
推荐引用方式
GB/T 7714
Jiao P,Zhou D,Liu, Wenjia. Research on the key diagnosis technology of PROFIBUS-DP based on FPGA[C]//CEIS; IFST; National Chin-Yi University of Technology; Scientific.Net. Zurich-Durnten, Switzerland:Trans Tech Publications Ltd,2014:1743-1746.
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