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题名: Research on the key diagnosis technology of PROFIBUS-DP based on FPGA
作者: Jiao P(焦平) ; Zhou D(周侗) ; Liu, Wenjia
作者部门: 工业控制网络与系统研究室
会议名称: 2014 International Conference on Mechatronics and Intelligent Materials, MIM 2014
会议日期: May 18, 2014 - May 19, 2014
会议地点: Lijiang, China
会议主办者: CEIS; IFST; National Chin-Yi University of Technology; Scientific.Net
会议录: Advanced Materials Research
会议录出版者: Trans Tech Publications Ltd
会议录出版地: Zurich-Durnten, Switzerland
出版日期: 2014
页码: 1743-1746
收录类别: EI
ISSN号: 1022-6680
ISBN号: 9783038351412
关键词: Materials ; Materials science
摘要: This paper analyzes the characteristics of physical layer signals, communication protocols, and the timing of PROFIBUS-DP, at last proposed a kind key technologies diagnosis scheme of PROFIBUS-DP, which based on FPGA. The scheme requires only a few peripheral circuits and use of the FPGA logic synthesis external signal, can be completed in two-way isolation of the physical layer status of DP, data flow direction, baud rate detection and other functions, which can be applied to diagnosis failure of PROFIBUS-DP. © (2014) Trans Tech Publications, Switzerland.
语种: 英语
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/15148
Appears in Collections:工业控制网络与系统研究室_会议论文

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Recommended Citation:
焦平; 周侗; Liu, Wenjia.Research on the key diagnosis technology of PROFIBUS-DP based on FPGA.见:Trans Tech Publications Ltd.Advanced Materials Research,Zurich-Durnten, Switzerland,2014,1743-1746
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文件名: Research on the Key Diagnosis Technology of PROFIBUS-DP Based on FPGA.pdf
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