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Alternative TitleScanning probe clamping device for atomic force microscope
于鹏; 刘柱; 周磊; 杨洋; 王栋; 刘连庆; 焦念东
Rights Holder中国科学院沈阳自动化研究所
Patent Agent沈阳科苑专利商标代理有限公司 21002
Other AbstractThe utility model relates to a scanning probe clamping device for atomic force microscope; the device comprises a fixed clamp, a probe clamping connector, and a probe clamp; the probe clamping connector is fixed to the fixed clamp and is connected to the probe clamp. The device of the utility model is small in size and light in weight; it can be secured to a piezoelectric ceramic driver and can be applied to a reversed-type atomic force microscope scanning head. The clamping device is able to realize the fast detachment of a probe clamp, the fast mounting and fixing of a probe and the vibration of Nano grade provided to the probe.
PCT Attributes
Application Date2014-05-20
Date Available2014-09-10
Application NumberCN201420259994.4
Open (Notice) NumberCN203825035U
Contribution Rank1
Document Type专利
Recommended Citation
GB/T 7714
于鹏,刘柱,周磊,等. 一种用于原子力显微镜的扫描探针夹持装置[P]. 2014-09-10.
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