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一种光电成像系统性能评估实验分析方法
Alternative TitlePerformance evaluation experiment analysis method for photo-electric imaging system
赵怀慈; 刘海峥; 郝明国; 花海洋; 王立勇
Department光电信息技术研究室
Rights Holder中国科学院沈阳自动化研究所
Patent Agent沈阳科苑专利商标代理有限公司 21002
Country中国
Subtype发明授权
Status有权
Abstract本发明涉及一种光电成像系统性能评估实验分析方法,包括以下步骤:建立光电成像系统性能预测模型;在性能预测模型中划分输入因素集和输出指标集;对输入因素集进行筛选实验;根据筛选实验结果划分模型输入因素水平,建立模型输入因素水平表;根据模型输入因素水平表,选取正交表,形成实验方案;调用性能预测模型计算各实验方案对应的输出指标集;利用输出指标集进行极差分析和灵敏度分析,结束本次实验分析过程。本发明方法可以以最少的实验次数全面、典型、均衡可比的反映实验输入各因素对实验指标的影响,通过极差法分析确定各输入因素的最优水平和对输出指标的影响的主次关系,同时采用灵敏度分析法分析输入因素对输出指标的敏感程度。
Other AbstractThe invention relates to a performance evaluation experiment analysis method for a photo-electric imaging system, which includes the following steps: building a photo-electric imaging system performance prediction model; dividing input factor sets and output index sets in the photo-electric imaging system performance prediction model; conducting screening experiment on the input factor sets; dividing input factor levels of the model according to screening experiment results and building a model input factor level graph; selecting orthogonal graphs according to the model input factor level graph to form experiment schemes; invoking the performance prediction model to calculate the output index sets corresponding to each experiment scheme; and performing range analysis and sensitivity analysis by aid of the output index sets and finishing the experiment analysis process. The performance evaluation experiment analysis method for the photo-electric imaging system can compteltely, typically and equilibrium comparably reflect effects of all experiment input factors on experiment indexes with the fewest experiment times, analyzes and determines the optimum level of all the experiment input factors and primary and secondary relations of all the experiment input factors in effects on the output indexes through a range method, and simultaneously analyzes the sensitivity degree of the input factors on the output indexes through a sensitivity analysis method.
PCT Attributes
Application Date2010-12-29
2012-07-11
Date Available2015-04-08
Application NumberCN201010610980.9
Open (Notice) NumberCN102567608B
Language中文
Contribution Rank1
Document Type专利
Identifierhttp://ir.sia.cn/handle/173321/15995
Collection光电信息技术研究室
Affiliation中国科学院沈阳自动化研究所
Recommended Citation
GB/T 7714
赵怀慈,刘海峥,郝明国,等. 一种光电成像系统性能评估实验分析方法[P]. 2012-07-11.
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