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专利名称: 一种基于原子力显微术的石墨烯晶向快速检测方法
其他题名: Graphene crystal orientation rapid detection method based on atomic power microscopy
作者: 刘连庆; 张嵛; 席宁; 王越超; 董再励
所属部门: 机器人学研究室
专利权人: 中国科学院沈阳自动化研究所
专利代理: 沈阳科苑专利商标代理有限公司 21002
专利国别: 中国
专利类型: 发明授权
专利状态: 有效
摘要: 本发明涉及石墨烯晶向检测技术,具体是一种基于原子力显微术的石墨烯晶向快速检测方法,主要用于石墨烯加工制造领域。本发明采用AFM摩擦力扫描成像技术,在石墨烯材料上任意位置获取一条扫描摩擦力曲线,对该扫描数据运用小波变换和快速傅立叶变换,可提取出该摩擦力扫描线所包含的石墨烯原子的功率谱分布信息,进而作出石墨烯不同晶向的判别。本发明可在室温大气环境下,快速、方便、准确地实现石墨烯晶向的判别,具有重要的实用意义。
英文摘要: The invention relates to a graphene crystal orientation detection technique, in particular to a graphene crystal orientation rapid detection method based on the atomic power microscopy. The graphene crystal orientation rapid detection method based on the atomic power microscopy is mainly applied to the field of processing and manufacturing of graphene. According to the graphene crystal orientation rapid detection method based on the atomic power microscopy, the AFM friction scanning imaging technique is adopted, a scanning friction force curve is obtained at any position of a graphene material, the power spectrum distribution information of a graphene atom contained in the friction force scanning curve can be extracted from scanning data by means of wavelet transform and fast Fourier transform, and then different crystal orientations of the graphene are judged. The graphene crystal orientation rapid detection method based on the atomic power microscopy has the advantages of being capable of judging the crystal orientations of the graphene fast, conveniently and accurately in the indoor temperature environment, and high in practicability significance.
是否PCT专利:
申请日期: 2012-04-27
公开日期: 2013-10-30
授权日期: 2015-05-20
专利申请号: CN201210128565.9
公布/公告号: CN103376339B
语种: 中文
产权排序: 1
内容类型: 专利
URI标识: http://ir.sia.cn/handle/173321/16019
Appears in Collections:机器人学研究室_专利

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Recommended Citation:
刘连庆,张嵛,席宁,等. 一种基于原子力显微术的石墨烯晶向快速检测方法. CN103376339B. 2013.
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格式: Adobe PDF
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