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Modeling for Infrared Readout Integrated Circuit Based on Verilog-A
Wang X(王霄); Shi ZL(史泽林)
作者部门光电信息技术研究室
会议名称2nd International Seminar on High-Power Laser Interaction with Matter and Application / International Seminar on Space Surveillance Technology / 2nd Symposium on Combustion Diagnostics
会议日期OCT 19-24, 2014
会议地点Suzhou, PEOPLES R CHINA
会议主办者Chinese Soc Astronaut, Photoelectron Technol Comm, China Aerodynam Res & Dev Ctr, Acad Equipment, State Key Lab Laser Propuls & Applicat
会议录名称Proceedings of SPIE, SELECTED PAPERS FROM CONFERENCES OF THE PHOTOELECTRONIC TECHNOLOGY COMMITTEE OF THE CHINESE SOCIETY OF ASTRONAUTICS 2014, PT II
出版者SPIE
出版地Bellingham, WA
2014
收录类别EI ; CPCI(ISTP)
EI收录号20154801603674
WOS记录号WOS:000354371100056
产权排序1
ISSN号0277-786X
ISBN号978-1-62841-653-4
关键词Readout Integrated Circuit Behavioral Modeling Operational Amplifier Switch Noise
摘要Infrared detectors are the core of infrared imaging systems, while readout integrated circuits are the key components of detectors. In order to grasp the performance of circuits quickly and accurately, a method of circuit modeling using Verilog-A language is proposed, which present a behavioral simulation model for the ROIC. At first, a typical capacitor trans-impedance amplifier(CTIA) ROIC unit is showed, then the two essential parts of it, operational amplifier and switch are modeled on behavioral level. The op amp model concludes these non-ideal factors, such as finite gain-bandwidth product, input and output offset, output resistance and so on. Non-deal factors that affect switches are considered in the switch behavioral model, such as rise and fall time, on-resistance and so on. At last time-domain modeling method for noise is presented, which is compared with the classical frequency domain method for difference. The analysis results shows that in the situation that noise interested bandwidth(NIBW) is more than 5MHz, the difference between the two methods leads to less than 1% if the sample rate of noise is larger 4 times of the NIBW
语种英语
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文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/16106
专题光电信息技术研究室
通讯作者Wang X(王霄)
作者单位1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.University of the Chinese Academy of Sciences, Beijing, China
3.Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang, China
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Wang X,Shi ZL. Modeling for Infrared Readout Integrated Circuit Based on Verilog-A[C]//Chinese Soc Astronaut, Photoelectron Technol Comm, China Aerodynam Res & Dev Ctr, Acad Equipment, State Key Lab Laser Propuls & Applicat. Bellingham, WA:SPIE,2014.
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