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题名: Modeling for Infrared Readout Integrated Circuit Based on Verilog-A
作者: Wang X(王霄); Shi ZL(史泽林)
作者部门: 光电信息技术研究室
会议名称: 4th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014
会议日期: OCT 19-24, 2014
会议地点: Suzhou, PEOPLES R CHINA
会议主办者: Chinese Soc Astronaut, Photoelectron Technol Comm, China Aerodynam Res & Dev Ctr, Acad Equipment, State Key Lab Laser Propuls & Applicat
会议录: Proceedings of SPIE, SELECTED PAPERS FROM CONFERENCES OF THE PHOTOELECTRONIC TECHNOLOGY COMMITTEE OF THE CHINESE SOCIETY OF ASTRONAUTICS 2014, PT II
会议录出版者: SPIE
会议录出版地: Bellingham, WA
出版日期: 2014
收录类别: EI ; CPCI(ISTP)
ISSN号: 0277-786X
ISBN号: 978-1-62841-653-4
关键词: Readout integrated circuit ; Behavioral modeling ; Operational amplifier ; Switch ; Noise
摘要: Infrared detectors are the core of infrared imaging systems, while readout integrated circuits are the key components of detectors. In order to grasp the performance of circuits quickly and accurately, a method of circuit modeling using Verilog-A language is proposed, which present a behavioral simulation model for the ROIC. At first, a typical capacitor trans-impedance amplifier(CTIA) ROIC unit is showed, then the two essential parts of it, operational amplifier and switch are modeled on behavioral level. The op amp model concludes these non-ideal factors, such as finite gain-bandwidth product, input and output offset, output resistance and so on. Non-deal factors that affect switches are considered in the switch behavioral model, such as rise and fall time, on-resistance and so on. At last time-domain modeling method for noise is presented, which is compared with the classical frequency domain method for difference. The analysis results shows that in the situation that noise interested bandwidth(NIBW) is more than 5MHz, the difference between the two methods leads to less than 1% if the sample rate of noise is larger 4 times of the NIBW
语种: 英语
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/16106
Appears in Collections:光电信息技术研究室_会议论文

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Recommended Citation:
Wang X,Shi ZL. Modeling for Infrared Readout Integrated Circuit Based on Verilog-A[C]. 见:4th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014. Suzhou, PEOPLES R CHINA. OCT 19-24, 2014.
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