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AFM tip-induced dielectrophoresis for 3D manipulation of nanoparticles
Zhou PL(周培林); Cong PT(丛培田); Yu HB(于海波); Li P(李鹏); Wei FN(魏发南); Liu LQ(刘连庆)
作者部门机器人学研究室
会议名称4th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014
会议日期October 27-31, 2014
会议地点Taipei, Taiwan
会议录名称2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014 - Conference Proceedings
出版者IEEE
出版地Piscataway, NJ, USA
2014
页码177-181
收录类别EI ; CPCI(ISTP)
EI收录号20151500725959
WOS记录号WOS:000380389000026
产权排序1
ISSN号2373-5422
ISBN号978-1-4799-7923-3
关键词Afm Dielectrophoresis 3d Manipulation Nanoparticles Nanoparticles
摘要Atomic force microscopy (AFM) and dielectrophoresis (DEP) technologies have been used as excellent tools for nanomanipulation and nanoassembly. AFM-based manipulation exhibits excellent positioning and very high accuracy. The advantage of DEP is its ability to carry out parallel and massive manipulation of nanomaterials. In this study, we develop AFM tip-induced dielectrophoresis for three dimensional (3D) manipulation of nanoparticles by integrating AFM with DEP techniques. A spatially nonuniform electric field can be induced when applying alternating current (AC) voltage between the AFM tip and a glass substrate coated with a thin layer of indium tin oxide (ITO). This work mainly focuses on the theoretical analysis and numerical simulation of the electric-field distribution between the probe tip and the ITO glass. Finally, we experimentally demonstrate the manipulation and assembly of dielectric nanoparticles with an average diameter of 200 nm. Compared with the traditional DEP method, predesigned electrodes are not required. The spatial electric-field distribution depends on the position of the AFM probe. Therefore, AFM-tip-induced dielectrophoresis is more flexible and efficient.
语种英语
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/16114
专题机器人学研究室
通讯作者Yu HB(于海波)
作者单位1.School of Mechanical Engineering, Shenyang Ligong University, Shenyang, 110159, China
2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China
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GB/T 7714
Zhou PL,Cong PT,Yu HB,et al. AFM tip-induced dielectrophoresis for 3D manipulation of nanoparticles[C]. Piscataway, NJ, USA:IEEE,2014:177-181.
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