The method to accomplish the simple and fast nanomanipulation with a common atomic force microscopy(AFM)was proposed. With the imaging function of the AFM and the lithography function of the AFM probe, the displacement characteristics of the piezoelectric tube(PZT) were recorded and measured along X and Y axes, solving the problem that it is impossible to measure the PZT displacement along Xand Yaxes by the common AFM itself. Prandtl-Ishlinskii (PI)model was used to describe the PZT hysteresis nonlinearity characteristics, then the feed forward controller was constructed, solving the problem of the PZT actuation in arbitrary trajectory for the AFM probe. The motion path of the AFM probe was designed by using the virtual nano-hand strategy (VNHS).The polystyrene nanoparticle with the diameter of 200 nm was continuously manipulated in a broken line within the task space square of 15μm×15μm through driving the AFM probe by the constructed feed forward controller. Besides, a silver stick with the length of about 1.3μm in a fixed pose was also continuously pushed in parallel with the distance more than 5μm.The whole motion time can be greatly saved for the absence of the local scanning process, and the average single pushing time reduces within 10s.