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题名: In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation
作者: Li P(李鹏); Liu LQ(刘连庆); Yang Y(杨洋); Wang YC(王越超); Li GY(李广勇)
作者部门: 机器人学研究室
关键词: Capacitance compensation (CC) ; in-phase bias modulation (IPBM) mode ; scanning ion conductance microscopy (SICM) ; signal-to-noise ratio (SNR)
刊名: IEEE Transactions on Industrial Electronics
ISSN号: 0278-0046
出版日期: 2015
卷号: 62, 期号:10, 页码:6508-6518
收录类别: SCI ; EI
产权排序: 1
项目资助者: National Natural Science Foundation of China under Project 61433017 and Project 61327014, in part by the Instrument Development Project of the Chinese Academy of Sciences (CAS) under Project YZ201245, and in part by the CAS FEA International Partnership Program for Creative Research Teams.
摘要: The in-phase bias modulation (IPBM) mode of scanning ion conductance microscopy (SICM), which has advantages of both the dc mode and the traditional ac mode, is immune to low-frequency external electronic interference and potential drift while maintaining a high scanning speed. However, the IPBM mode still suffers from a low-signal-to-noise ratio (SNR). In this paper, we propose a capacitance compensation (CC) method to solve the problem in the IPBM mode of SICM. After CC, the signal level is significantly increased while the noise level remains unchanged. The increased SNR not only improves the image quality but also allows the system to work at a higher modulation frequency, thus increasing potential for fast scan. Experimental results verify the effectiveness of the IPBM mode of SICM with CC.
语种: 英语
WOS记录号: WOS:000361534100052
WOS标题词: Science & Technology ; Technology
类目[WOS]: Automation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
关键词[WOS]: ATOMIC-FORCE MICROSCOPY ; LIVING CELLS ; NANOSCALE ; SYSTEM
研究领域[WOS]: Automation & Control Systems ; Engineering ; Instruments & Instrumentation
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内容类型: 期刊论文
URI标识: http://ir.sia.cn/handle/173321/16972
Appears in Collections:机器人学研究室_期刊论文

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