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In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation
Li P(李鹏); Liu LQ(刘连庆); Yang Y(杨洋); Wang YC(王越超); Li GY(李广勇)
作者部门机器人学研究室
关键词Capacitance Compensation (Cc) In-phase Bias Modulation (Ipbm) Mode Scanning Ion Conductance Microscopy (Sicm) Signal-to-noise Ratio (Snr)
发表期刊IEEE Transactions on Industrial Electronics
ISSN0278-0046
2015
卷号62期号:10页码:6508-6518
收录类别SCI ; EI
EI收录号20153801280048
WOS记录号WOS:000361534100052
产权排序1
资助机构National Natural Science Foundation of China under Project 61433017 and Project 61327014, in part by the Instrument Development Project of the Chinese Academy of Sciences (CAS) under Project YZ201245, and in part by the CAS FEA International Partnership Program for Creative Research Teams.
摘要The in-phase bias modulation (IPBM) mode of scanning ion conductance microscopy (SICM), which has advantages of both the dc mode and the traditional ac mode, is immune to low-frequency external electronic interference and potential drift while maintaining a high scanning speed. However, the IPBM mode still suffers from a low-signal-to-noise ratio (SNR). In this paper, we propose a capacitance compensation (CC) method to solve the problem in the IPBM mode of SICM. After CC, the signal level is significantly increased while the noise level remains unchanged. The increased SNR not only improves the image quality but also allows the system to work at a higher modulation frequency, thus increasing potential for fast scan. Experimental results verify the effectiveness of the IPBM mode of SICM with CC.
语种英语
WOS标题词Science & Technology ; Technology
WOS类目Automation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
关键词[WOS]ATOMIC-FORCE MICROSCOPY ; LIVING CELLS ; NANOSCALE ; SYSTEM
WOS研究方向Automation & Control Systems ; Engineering ; Instruments & Instrumentation
引用统计
被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.sia.cn/handle/173321/16972
专题机器人学研究室
通讯作者Li P(李鹏)
作者单位1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.University of the Chinese Academy of Sciences, Beijing, China
3.Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, United States
推荐引用方式
GB/T 7714
Li P,Liu LQ,Yang Y,et al. In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation[J]. IEEE Transactions on Industrial Electronics,2015,62(10):6508-6518.
APA Li P,Liu LQ,Yang Y,Wang YC,&Li GY.(2015).In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation.IEEE Transactions on Industrial Electronics,62(10),6508-6518.
MLA Li P,et al."In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation".IEEE Transactions on Industrial Electronics 62.10(2015):6508-6518.
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