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Edge detection using matched filter
Luo HB(罗海波); Jiao AB(焦安波); Xu LY(许凌云); Shao CY(邵春艳)
作者部门光电信息技术研究室
会议名称27th Chinese Control and Decision Conference, CCDC 2015
会议日期May 23-25, 2015
会议地点Qingdao, China
会议录名称Proceedings of the 2015 27th Chinese Control and Decision Conference, CCDC 2015
出版者IEEE
出版地Piscataway, NJ, USA
2015
页码1132-1136
收录类别EI ; CPCI(ISTP)
EI收录号20154401482116
WOS记录号WOS:000375232902084
产权排序1
ISBN号978-1-4799-7016-2
关键词Edge Detection Matched Filter Local Adaptive Threshold Real-time Application Noise Suppression
摘要For target tracking, automatic target recognition and detection applications, they value edge detection sensibility, precision and location accuracy rather than other criterions. Aimed at these three criterions, this paper presents an edge detection algorithm based on matched filter. Firstly, a matched filter was designed by analyzing the edge model for natural image, then the edge response was computed using the designed matched filter; secondly, the lower and discontinuous filtered responses were further suppressed using a dedicated one-dimension filter; finally, the edge image was obtained by binarizing the edge response with a local adaptive threshold. Experimental results illustrate that the proposed algorithm has more improvement than the Sobel and Canny operators in detection sensibility, precision and location accuracy. Moreover, the algorithm can be implemented with parallel pipeline using FPGA, so it is also rather suitable for real-time applications.
语种英语
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/17205
专题光电信息技术研究室
作者单位1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
3.Key Laboratory of Optical-Electronics Information Processing, Chinese Academy of Science, Shenyang, China
4.Key Laboratory of Image Understanding and Computer Vision, Liaoning Province, Shenyang, China
推荐引用方式
GB/T 7714
Luo HB,Jiao AB,Xu LY,et al. Edge detection using matched filter[C]. Piscataway, NJ, USA:IEEE,2015:1132-1136.
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