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High precision size measurement system of industrial profiles section | |
Zhang YC(张宜弛)![]() ![]() ![]() | |
Department | 数字工厂研究室 |
Conference Name | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) |
Conference Date | June 8-12, 2015 |
Conference Place | Shenyang, China |
Source Publication | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) |
Publisher | IEEE |
Publication Place | Piscataway, NJ, USA |
2015 | |
Pages | 415-419 |
Indexed By | EI ; CPCI(ISTP) |
EI Accession number | 20161402187683 |
WOS ID | WOS:000380502300080 |
Contribution Rank | 1 |
ISSN | 2379-7711 |
ISBN | 978-1-4799-8730-6 |
Keyword | Machine Vision Double Telecentric Lens Section Size Measurement Subpixel |
Abstract | This paper implements a non-contact measurement system based on machine vision for industrial profiles section, which uses double telecentric lens optical system as image acquisition device. The key procedures using double telecentric lens optical system to get cross section image of measured profile are described in details. Based on the profile characteristic of section itself, we applied smooth filtering and automatic threshold binarization algorithm in image preprocessing, and improve the detection accuracy through subpixel edge detection algorithm. Moreover, combined with high precision section edge images, we realized some practical functions such as geometric measurement, fitting, and contrasting with CAD drawings, etc. The proposed system with high speed, high accuracy and easy maintenance can satisfy the requirement of high precision for industrial profiles section size measurement. |
Language | 英语 |
Citation statistics | |
Document Type | 会议论文 |
Identifier | http://ir.sia.cn/handle/173321/17350 |
Collection | 数字工厂研究室 |
Affiliation | 1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China 2.Wuxi CAS Ubiquitous Information, Technology RandD Center Co., Ltd, Wuxi, China |
Recommended Citation GB/T 7714 | Zhang YC,Wu Y,Zhou XF,et al. High precision size measurement system of industrial profiles section[C]. Piscataway, NJ, USA:IEEE,2015:415-419. |
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High precision size (570KB) | 会议论文 | 开放获取 | CC BY-NC-SA | View Application Full Text |
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