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High precision size measurement system of industrial profiles section
Zhang YC(张宜弛); Wu Y(吴阳); Zhou XF(周晓锋); Li S(李帅)
Department数字工厂研究室
Conference Name2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
Conference DateJune 8-12, 2015
Conference PlaceShenyang, China
Source Publication2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
PublisherIEEE
Publication PlacePiscataway, NJ, USA
2015
Pages415-419
Indexed ByEI ; CPCI(ISTP)
EI Accession number20161402187683
WOS IDWOS:000380502300080
Contribution Rank1
ISSN2379-7711
ISBN978-1-4799-8730-6
KeywordMachine Vision Double Telecentric Lens Section Size Measurement Subpixel
AbstractThis paper implements a non-contact measurement system based on machine vision for industrial profiles section, which uses double telecentric lens optical system as image acquisition device. The key procedures using double telecentric lens optical system to get cross section image of measured profile are described in details. Based on the profile characteristic of section itself, we applied smooth filtering and automatic threshold binarization algorithm in image preprocessing, and improve the detection accuracy through subpixel edge detection algorithm. Moreover, combined with high precision section edge images, we realized some practical functions such as geometric measurement, fitting, and contrasting with CAD drawings, etc. The proposed system with high speed, high accuracy and easy maintenance can satisfy the requirement of high precision for industrial profiles section size measurement.
Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/17350
Collection数字工厂研究室
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.Wuxi CAS Ubiquitous Information, Technology RandD Center Co., Ltd, Wuxi, China
Recommended Citation
GB/T 7714
Zhang YC,Wu Y,Zhou XF,et al. High precision size measurement system of industrial profiles section[C]. Piscataway, NJ, USA:IEEE,2015:415-419.
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