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A new approach for noise data detection based on cluster and information entropy
Zhou XF(周晓锋); Zhang YL(章永来); Hao SX(郝胜轩); Li S(李帅)
Department数字工厂研究室
Conference Name2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
Conference DateJune 8-12, 2015
Conference PlaceShenyang, China
Source Publication2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
PublisherIEEE
Publication PlacePiscataway, NJ, USA
2015
Pages1416-1419
Indexed ByEI ; CPCI(ISTP)
EI Accession number20161402187910
WOS IDWOS:000380502300257
Contribution Rank1
ISSN2379-7711
ISBN978-1-4799-8730-6
KeywordFast Search And Find Of Density Peaks Information Entropy Noise Data Detection
AbstractTo detect the noise data in the datasets and remove them, a new approach for noise data detection based on fast search and find density peaks (FSFDP) and information entropy (IE) was proposed in this article. In the proposed method, FSFDP was used to cluster the original datasets and remove the outliers. Then construct the rectangular panes and mesh generation for each class according to the clustering results. Calculate the IE of each class after projecting all samples to the mesh, and remove the samples which have the lower local density in the class. If the IE value change obviously after the sample was removed from the class, the sample was marked as a noise. Finally, the result of the experiment shows that the presented approach is effective and accurately.
Language英语
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/17360
Collection数字工厂研究室
AffiliationShenyang Institute of Automation, Chinese Academy of Sciences, Key Laboratory of Network Control System, Chinese Academy of Sciences, Shenyang, China
Recommended Citation
GB/T 7714
Zhou XF,Zhang YL,Hao SX,et al. A new approach for noise data detection based on cluster and information entropy[C]. Piscataway, NJ, USA:IEEE,2015:1416-1419.
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