| Calculating model for equivalent thermal defocus amount in infrared imaging system | |
Zhang CS(张程硕); Shi ZL(史泽林) ; Xu BS(徐保树); Feng B(冯斌)
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| Department | 光电信息技术研究室 |
| Source Publication | Infrared Physics and Technology
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| ISSN | 1350-4495 |
| 2016 | |
| Volume | 74Pages:72-80 |
| Indexed By | SCI ; EI |
| EI Accession number | 20160301810257 |
| WOS ID | WOS:000370091600010 |
| Contribution Rank | 1 |
| Funding Organization | Key Laboratory of Opto-Electronic Information Processing Foundation of Chinese Academy of Sciences (Grant No. CXJJ-15S110). |
| Keyword | Infrared Imaging System Thermal Effect Wave Aberration Defocus Athermalization |
| Abstract | The main effect of temperature change on infrared imaging system is the focus shift of infrared lenses. This paper analyzes the equivalent influence on imaging between the temperature change and the defocus at room temperature. In order to quantify the equivalence, we define an equivalent thermal defocus amount (ETDA). The ETDA describes the distance of the photosensitive surface shifting at room temperature, which has the same effect on imaging as the temperature changes. To model the ETDA, the expression of the focal shift as a function of temperature is obtained by solving partial differential equations for the thermal effect on light path firstly with some approximations. Then point spread functions of the thermal effect and defocus at room temperature are modeled based on wave aberration. The calculating model of ETDA is finally established by making their PSFs equal under the condition that the cutoff frequency of infrared imaging systems is much smaller than that of infrared lens. The experimental results indicate that defocus of ETDA at room temperature has the same influence on imaging as the thermal effect. Prospectively, experiments at high/low temperature can be replaced by experiments at room temperature with ETDA. |
| Language | 英语 |
| WOS Headings | Science & Technology ; Technology ; Physical Sciences |
| WOS Subject | Instruments & Instrumentation ; Optics ; Physics, Applied |
| WOS Keyword | ATHERMALIZATION |
| WOS Research Area | Instruments & Instrumentation ; Optics ; Physics |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sia.cn/handle/173321/17608 |
| Collection | 光电信息技术研究室 |
| Corresponding Author | Zhang CS(张程硕) |
| Affiliation | 1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, Liaoning, China 2.University of Chinese Academy of Sciences, Beijing, China 3.Key Laboratory of Opto-electronic Information Processing, Chinese Academy of Sciences, Shenyang, Liaoning, China |
| Recommended Citation GB/T 7714 | Zhang CS,Shi ZL,Xu BS,et al. Calculating model for equivalent thermal defocus amount in infrared imaging system[J]. Infrared Physics and Technology,2016,74:72-80. |
| APA | Zhang CS,Shi ZL,Xu BS,&Feng B.(2016).Calculating model for equivalent thermal defocus amount in infrared imaging system.Infrared Physics and Technology,74,72-80. |
| MLA | Zhang CS,et al."Calculating model for equivalent thermal defocus amount in infrared imaging system".Infrared Physics and Technology 74(2016):72-80. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Calculating model fo（3558KB） | 期刊论文 | 作者接受稿 | 开放获取 | ODC PDDL | View Application Full Text | |
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