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题名: Three-Dimensional Super-Resolution Morphology by Near-Field Assisted White-Light Interferometry
作者: Wang FF(王飞飞); Liu LQ(刘连庆); Yu P(于鹏); Yu HB(于海波); Liu Z(刘柱); Wang YC(王越超); Li WR(李文荣)
作者部门: 机器人学研究室
刊名: SCIENTIFIC REPORTS
ISSN号: 2045-2322
出版日期: 2016
卷号: 6, 页码:1-10
收录类别: SCI
产权排序: 1
项目资助者: NSFC/RGC [51461165501, CityU132/14] ; CAS-Croucher Joint Lab Scheme [9500011] ; CAS FEA International Partnership Program for Creative Research Teams ; Hong Kong Research Grants Council [CityU 116912]
摘要: Recent developments in far-field fluorescent microscopy have enabled nanoscale imaging of biological entities by ingenious applications of fluorescent probes. For non-fluorescence applications, however, scanning probe microscopy still remains one of the most commonly used methods to "image" nanoscale features in all three dimensions, despite its limited throughput and invasiveness to scanned samples. Here, we propose a time-efficient three-dimensional super-resolution microscopy method: near-field assisted white light interferometry (NFWLI). This method takes advantage of topography acquisition using white-light interferometry and lateral near-field imaging via a microsphere superlens. The ability to discern structures in central processing units (CPUs) with minimum feature sizes of approximately 50 nm in the lateral dimensions and approximately 10 nm in the axial dimension within 25 s (40 times faster than atomic force microscopes) was demonstrated. We elaborate in this paper the principles of NFWLI and demonstrate its potential for becoming a practical method for high-speed and non-toxic three-dimensional nanoscale imaging.
语种: 英语
WOS记录号: WOS:000374541700001
WOS标题词: Science & Technology
类目[WOS]: Multidisciplinary Sciences
关键词[WOS]: ELECTRON-MICROSCOPY ; ULTRASTRUCTURE ; INTERFERENCE ; RESOLUTION ; NANOSCOPE ; CELLS
研究领域[WOS]: Science & Technology - Other Topics
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内容类型: 期刊论文
URI标识: http://ir.sia.cn/handle/173321/18662
Appears in Collections:机器人学研究室_期刊论文

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Recommended Citation:
Wang FF,Liu LQ,Yu P,et al. Three-Dimensional Super-Resolution Morphology by Near-Field Assisted White-Light Interferometry[J]. SCIENTIFIC REPORTS,2016,6:1-10.
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文件名: Three-Dimensional Super-Resolution Morphology by Near-Field Assisted White-Light Interferometry.pdf
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