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Reduction of artefacts and noise for a wavefront coding athermalized infrared imaging system
Feng B(冯斌); Zhang, Xiaodong; Shi ZL(史泽林); Xu BS(徐保树); Zhang CS(张程硕)
Department光电信息技术研究室
Source PublicationJournal of Optics (United Kingdom)
ISSN2040-8978
2016
Volume18Issue:7Pages:1-13
Indexed BySCI ; EI
EI Accession number20163002646956
WOS IDWOS:000383908800059
Contribution Rank1
Funding OrganizationInnovation Foundation of the Chinese Academy of Sciences (CXJJ-14-S116) ; The State Key Development Program of Basic Research of China (973) (2011CB706700).
KeywordWavefront Coding Infrared Imaging System Artefact Noise
AbstractBecause of obvious drawbacks including serious artefacts and noise in a decoded image, the existing wavefront coding infrared imaging systems are seriously restricted in application. The proposed ultra-precision diamond machining technique manufactures an optical phase mask with a form manufacturing errors of approximately 770 nm and a surface roughness value Ra of 5.44 nm. The proposed decoding method outperforms the classical Wiener filtering method in three indices of mean square errors, mean structural similarity index and noise equivalent temperature difference. Based on the results mentioned above and a basic principle of wavefront coding technique, this paper further develops a wavefront coding infrared imaging system. Experimental results prove that our wavefront coding infrared imaging system yields a decoded image with good quality over a temperature range from -40 °C to +70 °C.
Language英语
WOS HeadingsScience & Technology ; Physical Sciences
WOS SubjectOptics
WOS KeywordCUBIC PHASE MASK ; ION-IMPLANTATION ; LENS ; ERROR
WOS Research AreaOptics
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/18835
Collection光电信息技术研究室
Corresponding AuthorFeng B(冯斌)
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.Key Laboratory of Opto-electronic Information Processing, Chinese Academy of Sciences, Shenyang 110016, China
3.State Key Laboratory of Precision Measuring Technology and Instruments, Centre of MicroNano Manufacturing Technology, Tianjin University, Tianjin, 300072, China
4.University of Chinese Academy of Science, Beijing 100049, China
Recommended Citation
GB/T 7714
Feng B,Zhang, Xiaodong,Shi ZL,et al. Reduction of artefacts and noise for a wavefront coding athermalized infrared imaging system[J]. Journal of Optics (United Kingdom),2016,18(7):1-13.
APA Feng B,Zhang, Xiaodong,Shi ZL,Xu BS,&Zhang CS.(2016).Reduction of artefacts and noise for a wavefront coding athermalized infrared imaging system.Journal of Optics (United Kingdom),18(7),1-13.
MLA Feng B,et al."Reduction of artefacts and noise for a wavefront coding athermalized infrared imaging system".Journal of Optics (United Kingdom) 18.7(2016):1-13.
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