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Noise analysis of a CDS circuit with offset canceling
Wang X(王霄); Shi ZL(史泽林); Xu BS(徐保树)
Department光电信息技术研究室
Conference Name11th IEEE International Conference on Advanced Semiconductor Integrated Circuits (ASIC), ASICON 2015
Conference DateNovember 3-6, 2015
Conference PlaceChengdu, China
Author of SourceFudan University; IEEE Beijing Section
Source PublicationProceedings - 2015 IEEE 11th International Conference on ASIC, ASICON 2015
PublisherIEEE
Publication PlacePiscataway, NJ, USA
2015
Pages1-4
Indexed ByEI ; CPCI(ISTP)
EI Accession number20163402733633
WOS IDWOS:000398709000040
Contribution Rank1
ISBN978-1-4799-8483-1
KeywordCorrelated Double Sampler(Cds) Noise Model Time Domain Simulation(Tds) Power Spectrum Density(Psd)
AbstractCorrelated double samplers(CDS) are widely used in infrared imaging systems which can suppress 1/f noise effectively. Since the concept was raised, many types of CDS have been constructed whose advantages are different in tradeoff among layout area, speed and power dissipation. This paper presents a method of noise analysis for a CDS that has the function of offset canceling, which starts from the transient noise behavior due to noise models in each clock phase. Then based on the theory of stationary random process, power spectrum density(PSD) of output noise is derived. At last a time domain simulation(TDS) is applied to verify the feasibility of the noise analysis method we proposed, which corresponds well. The proposed method provides a noise estimation method of the CDS through which we can deduce contributions from each noise source to the output noise, moreover whose simulation time is much shorter than that of a TDS.
Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/18845
Collection光电信息技术研究室
Corresponding AuthorWang X(王霄)
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, University of the Chinese Academy of Sciences, Key Laboratory of Opto-Electronic Information Processing, Shenyang, 110016, China
2.Shenyang Institute of Automation, Chinese Academy of Sciences, Key Laboratory of Opto-Electronic Information Processing, Shenyang, 110016, China
Recommended Citation
GB/T 7714
Wang X,Shi ZL,Xu BS. Noise analysis of a CDS circuit with offset canceling[C]//Fudan University; IEEE Beijing Section. Piscataway, NJ, USA:IEEE,2015:1-4.
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