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一种基于边缘结构的背景杂波度量方法
Alternative TitleBackground clutter measurement method based on edge structures
史泽林; 夏仁波; 王学娟; 向伟; 惠斌; 王喆鑫
Department光电信息技术研究室
Rights Holder中国科学院沈阳自动化研究所
Patent Agent沈阳科苑专利商标代理有限公司 21002
Country中国
Subtype发明
Status实审
Abstract本发明涉及一种基于边缘结构的背景杂波度量方法,将背景图像分割成大小与目标图像大小相同的单元;建立图像结构特征空间上的目标图像与单元背景杂波图像之间的相似性度量;通过梯度直方图的方法建立目标图像与单元背景杂波图像的边缘结构特征描述,并选用巴氏系数计算图像边缘结构的相似性度量;以目标图像与单元背景杂波图像的边缘结构相似性度量对目标图像和单元背景杂波图像的结构相似性度量进行加权作为单元背景图像的杂波度量,所有单元背景图像杂波度量的平均值,作为整幅背景图像的杂波度量。本发明充分体现人眼视觉在目标识别中主要关注物体结构的特性,提高对成像系统外场性能预测和评估的准确度。
Other AbstractThe invention relates to a background clutter measurement method based on edge structures, comprising the following steps: segmenting a background image into cells of the same size as a target image; establishing a similarity measure between the target image and cell background clutter images in an image structure feature space; establishing edge structure feature descriptions of the target image and the cell background clutter images through a gradient histogram method, and selecting a Bhattacharyya coefficient to calculate the similarity measure between the image edge structures; and weighting the structure similarity measure between the target image and each cell background clutter image as the clutter measure of the cell background image based on the edge structure similarity measure between the target image and the cell background clutter image, and taking the average clutter measure of all the cell background images as the clutter measure of the whole background image. The method fully embodies the fact that human eye vision mainly focuses on the object structure in target identification, and improves the accuracy of imaging system field performance prediction and evaluation.
PCT Attributes
Application Date2014-11-10
2016-06-08
Application NumberCN201410628060.8
Open (Notice) NumberCN105654452A
Language中文
Contribution Rank1
Document Type专利
Identifierhttp://ir.sia.cn/handle/173321/18960
Collection光电信息技术研究室
Affiliation中国科学院沈阳自动化研究所
Recommended Citation
GB/T 7714
史泽林,夏仁波,王学娟,等. 一种基于边缘结构的背景杂波度量方法[P]. 2016-06-08.
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