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题名: A rapid and automated relocation method of an AFM probe for high-resolution imaging
作者: Zhou PL(周培林); Yu HB(于海波); Shi JL(施佳林); Jiao ND(焦念东); Wang ZD(王志东); Wang YC(王越超); Liu LQ(刘连庆)
作者部门: 机器人学研究室
关键词: AFM ; relocation ; automated ; label-free ; nano targets
刊名: Nanotechnology
ISSN号: 0957-4484
出版日期: 2016
卷号: 27, 期号:39, 页码:1-10
收录类别: SCI ; EI
产权排序: 1
项目资助者: National Natural Science Foundation of China (Nos. 61475183 and 61503258) ; the CAS FEA International Partnership Program for Creative Research Teams ; and the Instrument Developing Project of the Chinese Academy of Sciences (No. yz201339)
摘要: The atomic force microscope (AFM) is one of the most powerful tools for high-resolution imaging and high-precision positioning for nanomanipulation. The selection of the scanning area of the AFM depends on the use of the optical microscope. However, the resolution of an optical microscope is generally no larger than 200 nm owing to wavelength limitations of visible light. Taking into consideration the two determinants of relocation-relative angular rotation and positional offset between the AFM probe and nano target-it is therefore extremely challenging to precisely relocate the AFM probe to the initial scan/manipulation area for the same nano target after the AFM probe has been replaced, or after the sample has been moved. In this paper, we investigate a rapid automated relocation method for the nano target of an AFM using a coordinate transformation. The relocation process is both simple and rapid; moreover, multiple nano targets can be relocated by only identifying a pair of reference points. It possesses a centimeter-scale location range and nano-scale precision. The main advantages of this method are that it overcomes the limitations associated with the resolution of optical microscopes, and that it is label-free on the target areas, which means that it does not require the use of special artificial markers on the target sample areas. Relocation experiments using nanospheres, DNA, SWCNTs, and nano patterns amply demonstrate the practicality and efficiency of the proposed method, which provides technical support for mass nanomanipulation and detection based on AFM for multiple nano targets that are widely distributed in a large area.
语种: 英语
WOS记录号: WOS:000383998300005
WOS标题词: Science & Technology ; Technology ; Physical Sciences
类目[WOS]: Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
关键词[WOS]: ATOMIC-FORCE MICROSCOPY ; CARBON NANOTUBES ; ULTRATHIN FILMS ; SCANNING-PROBE ; TIP ; DNA ; SAMPLES ; MICA ; SUBSTRATE ; EVOLUTION
研究领域[WOS]: Science & Technology - Other Topics ; Materials Science ; Physics
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内容类型: 期刊论文
URI标识: http://ir.sia.cn/handle/173321/19232
Appears in Collections:机器人学研究室_期刊论文

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Recommended Citation:
Zhou PL,Yu HB,Shi JL,et al. A rapid and automated relocation method of an AFM probe for high-resolution imaging[J]. Nanotechnology,2016,27(39):1-10.
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