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题名: AFM image reconstruction research based on drift correlation model
作者: Luan FJ(栾方军); Xie, Weiqi; Yuan S(袁帅); Xia, Xinghua; Kan, Fenglong
作者部门: 机器人学研究室
会议名称: IEEE International Conference on Robotics and Biomimetics (ROBIO)
会议日期: December 06-09, 2015
会议地点: Zhuhai, PEOPLES R CHINA
会议主办者: IEEE, IEEE ROBOT AUTOMA SOC, SHENZHEN ACAD ROBOT, GUANGDONG UNIV TECHNOL, MICHIGAN STATE UNIV, IT CHIBA AC, RSJ, SICE, JSME, IEEE/CAA J AUTOMATICA SINICA, UNIV HONG KONG
会议录: 2015 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND BIOMIMETICS (ROBIO)
会议录出版者: IEEE
会议录出版地: NEW YORK
出版日期: 2015
页码: 1906-1911
收录类别: EI ; CPCI(ISTP)
ISBN号: 978-1-4673-9675-2
摘要: The system drift causes the AFM tip to stochastically displacement in the sample surface of substrate when atomic force microscope imaging. This will give a notable effect on AFM image procedure, and results in distortion of scanning images. For this distortion, the paper establishes image compensation model, through associating the reference image and deformation image of the same sample region with 0 degrees and 90 degrees scanning angle respectively, to estimate horizontal and vertical displacement between the two images for reconstructing the reference image. The algorithm is verified by using simulation, and then is applied to AFM images. After image correction, nanoparticles aspect ratio is closer to 1, and relative distance changes between the nanoparticles from the system drift also meet the drift measurement results. These experimental results illustrate that the proposed method can effectively reduce the influence of system drift on AFM images and improve AFM image quality.
语种: 英语
产权排序: 2
WOS记录号: WOS:000380476200318
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/19366
Appears in Collections:机器人学研究室_会议论文

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Recommended Citation:
Luan FJ,Xie, Weiqi,Yuan S,et al. AFM image reconstruction research based on drift correlation model[C]. 见:IEEE International Conference on Robotics and Biomimetics (ROBIO). Zhuhai, PEOPLES R CHINA. December 06-09, 2015.
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