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Joint Geometric and Photometric Direct Image Registration Based on Lie Algebra Parameterization
Li CX(李晨曦); Shi ZL(史泽林); Liu YP(刘云鹏)
Department光电信息技术研究室
Conference NameInternational Symposium on Infrared Technology and Application and the International Symposiums on Robot Sensing and Advanced Control
Conference DateMay 9-11, 2016
Conference PlaceBeijing
Source PublicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Publication PlaceBellingham, WA
2016
Pages1-7
Indexed ByEI ; CPCI(ISTP)
EI Accession number20170503310113
WOS IDWOS:000391228600068
Contribution Rank1
ISSN0277-786X
ISBN978-1-5106-0772-9
KeywordImage Registration Lighting Changes Lie Algebra Efficient Second-order Minimization Lie Group
Abstract

In this paper, we consider direct image registration problem which estimate the geometric and photometric transformations between two images. The efficient second-order minimization method (ESM) is based on a second-order Taylor series of image differences without computing the Hessian under brightness constancy assumption. This can be done due to the fact that the considered geometric transformations is Lie group and can be parameterized by its Lie algebra. In order to deal with lighting changes, we extend ESM to the compositional dual efficient second-order minimization method (CDESM). In our approach, the photometric transformations is parameterized by its Lie algebra with compositional operation, which is similar to that of geometric transformations. Our algorithm can give a second-order approximation of image differences with respect to geometric and photometric parameters. The geometric and photometric parameters are simultaneously obtained by non-linear least-square optimization. Our algorithm preserves the advantages of the original ESM method which has high convergence rate and large capture radius. Experimental results show that our algorithm is more robust to lighting changes and has higher registration accuracy compared to previous algorithms.

Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/19481
Collection光电信息技术研究室
Corresponding AuthorLi CX(李晨曦)
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, Liaoning, 110016, China
2.University of Chinese Academy of Sciences, Beijing, 100049, China
3.Key Laboratory of Opto-electronic Information Processing, Chinese Academy of Sciences, Shenyang, Liaoning, 110016, China
Recommended Citation
GB/T 7714
Li CX,Shi ZL,Liu YP. Joint Geometric and Photometric Direct Image Registration Based on Lie Algebra Parameterization[C]. Bellingham, WA:SPIE,2016:1-7.
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