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A Temperature Sensor Failure Diagnosis Approach in Frequency
Han XJ(韩晓佳); Jiang, Jin; Xu AD(徐皑冬); Yan BJ(闫炳均); Pei C(裴超)
作者部门工业控制网络与系统研究室
会议名称2016 Prognostics and System Health Management Conference (PHM-2016)
会议日期October 19-21, 2016
会议地点Chengdu, China
会议主办者IEEE Reliability Society and Technical Committee of Instrumentation and Testing of CSAA
会议录名称Proceedings of 2016 Prognostics and System Health Management Conference
出版者IEEE
出版地New York
2016
页码1-4
收录类别EI ; CPCI(ISTP)
EI收录号20171203474630
WOS记录号WOS:000393560200035
产权排序1
ISBN号978-1-5090-2777-4
关键词Temperature Transmitter Temperature Sensor Failure Diagnosis Characteristic Frequency
摘要This paper introduces an on-line diagnostic function for temperature sensors using a noise analysis approach. The deviation of temperature measurements from their average value is treated as the noise input data, then the noise data is filtered through the Butterworth filter. The power spectrum density estimation of the noise data is obtained by using the Welch method. The first-order characteristic of the temperature sensor is used to obtain the characteristic frequency of the sensor, which can then be used to determine the working status of the sensor. Finally, through a large number of experiments, the results have shown that the sensor's characteristic frequency in a failure condition is significantly higher than that in the normal state. So it verifies the feasibility of on-line diagnosis by using the noise analysis approach for the temperature sensor.
语种英语
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文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/19507
专题工业控制网络与系统研究室
通讯作者Han XJ(韩晓佳)
作者单位1.Laboratory of Industrial Control Network and System, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
3.Department of Electrical and Computer Engineering, University of Western Ontario, London, ON, Canada
推荐引用方式
GB/T 7714
Han XJ,Jiang, Jin,Xu AD,et al. A Temperature Sensor Failure Diagnosis Approach in Frequency[C]//IEEE Reliability Society and Technical Committee of Instrumentation and Testing of CSAA. New York:IEEE,2016:1-4.
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