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Monitoring the metal transfer process of GMAW by a simplified laser backlight method
Wang ZZ(王振洲)
作者部门机器人学研究室
会议名称42nd Conference of the Industrial Electronics Society, IECON 2016
会议日期October 24-27, 2016
会议地点Florence, Italy
会议主办者IEEE Industrial Electronics Society (IES); Institute of Electrical and Electronics Engineers (IEEE)
会议录名称Proceedings of the IECON 2016 - 42nd Annual Conference of the Industrial Electronics Society
出版者IEEE Computer Society
出版地Washington, DC
2016
页码975-980
收录类别EI ; CPCI(ISTP)
EI收录号20170403283116
WOS记录号WOS:000399031201042
产权排序1
ISBN号978-1-5090-3474-1
关键词Mahine Vision Monitoring Image Processing Gmaw Metal Transfer Monitoring
摘要Due to its great productivity, Gas metal arc welding (GMAW) has been become the most frequently used automated welding process. Unfortunately, the metal transfer changes from solid to liquid, which causes spatters and fumes. As a result, the process is complicated and needs to be controlled for good welding quality and good process stability. In return, the fumes, spatters and energy consumption will be reduced. This paper aims at establishing the ability of monitoring the metal transfer process in the real welding environments for the automated welding robot to control the welding process on line. In this paper, we designed a compact and practical monitoring system to measure the metal transfer of gas metal arc welding (GMAW) robustly. To this end, the captured images are modeled and effective image processing algorithms are proposed. Experimental results verified the effectiveness of the proposed algorithms and the designed monitoring system.
语种英语
引用统计
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/19828
专题机器人学研究室
通讯作者Wang ZZ(王振洲)
作者单位State Key Lab of Robotics, Shenyang Institute of Automation, Chinese Academy of Science(CAS), Shen Yang City, China
推荐引用方式
GB/T 7714
Wang ZZ. Monitoring the metal transfer process of GMAW by a simplified laser backlight method[C]//IEEE Industrial Electronics Society (IES); Institute of Electrical and Electronics Engineers (IEEE). Washington, DC:IEEE Computer Society,2016:975-980.
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