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Local Scan for Compensation of Drift Contamination in AFM Based Nanomanipulation
Wang, Yucai; Li GY(李广勇); Liu LQ(刘连庆)
作者部门机器人学研究室
会议名称2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009)
会议日期October 10-15, 2009
会议地点St Louis, MO, USA
会议主办者IEEE Robot & Automat Soc (RA), Robot Soc Japan (RSJ), Soc Instruments & Control Engn, IEEE Ind Elect Soc, Inst Control, Robot & Syst Korea, ABB, Barrett Technol, Inc, Willow Garage, ROBOTIS, Aldebaran Robot
会议录名称2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009)
出版者IEEE Computer Society
出版地Piscataway, NJ, USA
2009
页码1345-1350
收录类别EI ; CPCI(ISTP)
EI收录号20100712703843
WOS记录号WOS:000285372900224
产权排序2
ISBN号978-1-4244-3803-7
关键词Nanomanipulation Atomic Force Microscope Drift Compensation
摘要Because of the presence of thermal drift, AFM (atomic force microscopy) images are always contaminated. Such contamination is one of the major hampers to achieve accurate and efficient AFM based nanomanipulation. Based on contaminated images, the manipulation operations often fail. In this paper, we apply a local scan method to identify and compensate the thermal drift contamination in the AFM image. After an AFM image is captured, the entire image is divided into several parts along y direction. A local scan is immediately performed in each part of the image to calculate the drift value at that very part. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, which lead to improved accuracy for AFM imaging and enhanced productivity for AFM based nanomanipulation.
语种英语
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被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/19870
专题机器人学研究室
通讯作者Wang, Yucai
作者单位1.Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15261, United States
2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Shenyang, Liaoning Province 110016, China
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Wang, Yucai,Li GY,Liu LQ. Local Scan for Compensation of Drift Contamination in AFM Based Nanomanipulation[C]//IEEE Robot & Automat Soc (RA), Robot Soc Japan (RSJ), Soc Instruments & Control Engn, IEEE Ind Elect Soc, Inst Control, Robot & Syst Korea, ABB, Barrett Technol, Inc, Willow Garage, ROBOTIS, Aldebaran Robot. Piscataway, NJ, USA:IEEE Computer Society,2009:1345-1350.
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