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Local Scan for Compensation of Drift Contamination in AFM Based Nanomanipulation
Wang, Yucai; Li GY(李广勇); Liu LQ(刘连庆)
Department机器人学研究室
Conference Name2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009)
Conference DateOctober 10-15, 2009
Conference PlaceSt Louis, MO, USA
Author of SourceIEEE Robot & Automat Soc (RA), Robot Soc Japan (RSJ), Soc Instruments & Control Engn, IEEE Ind Elect Soc, Inst Control, Robot & Syst Korea, ABB, Barrett Technol, Inc, Willow Garage, ROBOTIS, Aldebaran Robot
Source Publication2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009)
PublisherIEEE Computer Society
Publication PlacePiscataway, NJ, USA
2009
Pages1345-1350
Indexed ByEI ; CPCI(ISTP)
EI Accession number20100712703843
WOS IDWOS:000285372900224
Contribution Rank2
ISBN978-1-4244-3803-7
KeywordNanomanipulation Atomic Force Microscope Drift Compensation
AbstractBecause of the presence of thermal drift, AFM (atomic force microscopy) images are always contaminated. Such contamination is one of the major hampers to achieve accurate and efficient AFM based nanomanipulation. Based on contaminated images, the manipulation operations often fail. In this paper, we apply a local scan method to identify and compensate the thermal drift contamination in the AFM image. After an AFM image is captured, the entire image is divided into several parts along y direction. A local scan is immediately performed in each part of the image to calculate the drift value at that very part. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, which lead to improved accuracy for AFM imaging and enhanced productivity for AFM based nanomanipulation.
Language英语
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/19870
Collection机器人学研究室
Corresponding AuthorWang, Yucai
Affiliation1.Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15261, United States
2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Shenyang, Liaoning Province 110016, China
Recommended Citation
GB/T 7714
Wang, Yucai,Li GY,Liu LQ. Local Scan for Compensation of Drift Contamination in AFM Based Nanomanipulation[C]//IEEE Robot & Automat Soc (RA), Robot Soc Japan (RSJ), Soc Instruments & Control Engn, IEEE Ind Elect Soc, Inst Control, Robot & Syst Korea, ABB, Barrett Technol, Inc, Willow Garage, ROBOTIS, Aldebaran Robot. Piscataway, NJ, USA:IEEE Computer Society,2009:1345-1350.
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