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Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system
Chen SL(陈松林); Xia RB(夏仁波); Zhao JB(赵吉宾); Zhang HY(张洪瑶); Hu MB(胡茂邦)
作者部门装备制造技术研究室
关键词Three-dimensional Measurement Structured Light Phase Shifting Phase Error Analysis Phase Error Reduction
发表期刊Optical Engineering
ISSN0091-3286
2017
卷号56期号:3页码:1-9
收录类别SCI ; EI
EI收录号20171003421929
WOS记录号WOS:000397207200026
产权排序1
资助机构National Natural Science Foundation of China under Grant No. 51375476
摘要The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method.
语种英语
WOS标题词Science & Technology ; Physical Sciences
WOS类目Optics
关键词[WOS]HIGH DYNAMIC-RANGE ; 3-DIMENSIONAL SHAPE MEASUREMENT ; DIGITAL FRINGE PROJECTION ; SATURATION AVOIDANCE ; PROFILOMETRY ; POLARIZATION ; OBJECTS
WOS研究方向Optics
引用统计
文献类型期刊论文
条目标识符http://ir.sia.cn/handle/173321/20209
专题装备制造技术研究室
通讯作者Xia RB(夏仁波)
作者单位1.Chinese Academy of Sciences, Shenyang Institute of Automation, State Key Laboratory of Robotics, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Chen SL,Xia RB,Zhao JB,et al. Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system[J]. Optical Engineering,2017,56(3):1-9.
APA Chen SL,Xia RB,Zhao JB,Zhang HY,&Hu MB.(2017).Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system.Optical Engineering,56(3),1-9.
MLA Chen SL,et al."Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system".Optical Engineering 56.3(2017):1-9.
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