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Reliability and Temporality Optimization for Multiple Coexisting WirelessHART Networks in Industrial Environments
Jin X(金曦); Kong FX(孔繁鑫); Kong LH(孔令和); Liu, W; Zeng P(曾鹏)
Department工业控制网络与系统研究室
Source PublicationIEEE Transactions on Industrial Electronics
ISSN0278-0046
2017
Volume64Issue:8Pages:6591-6602
Indexed BySCI ; EI
EI Accession number20173804196064
WOS IDWOS:000405172300055
Contribution Rank1
Funding OrganizationNational Natural Science Foundation of China under Grant 61502474, 61233007 and 61501447, in part by the Youth Innovation Promotion Association of the Chinese Academy of Sciences
KeywordIndustrial Environment Channel Management Scheduling Algorithms Wireless Sensor Networks
AbstractWirelessHART is a networking technology that is widely-used in industrial wireless sensor networks. Its reliability and real-time performance are essential to industrial production. Many works have studied these two aspects, primarily focusing on a single WirelessHART network. However,multiple WirelessHART networks usually coexist in a real industrial environment. Applying existing approaches to such coexisting networks would cause performance degradation due to communication interference among these networks. In this paper, we propose a holistic framework that optimizes both reliability and temporality for multiple coexisting networks. The framework consists of two levels. The upper level targets communication channel management, and the lower level addresses data flow scheduling. For the upper level, we propose a network isolation algorithm that improves the data transmission reliability through dynamically adjusting channel assignments to different WirelessHART networks. For the lower level, we propose data flow scheduling algorithms that guarantee the temporality of data flows within each isolated network. These algorithms minimize the number of channels reserved by each isolated network and further enhance the transmission reliability through alleviating channel resource contention. We conduct trace-driven simulations of the channel management algorithm, and the results demonstrate that our algorithm exhibits stable performance and reduces packet loss by 36%. For the scheduling algorithms, the simulations demonstrate that in contrast with existing algorithms, the greater the number of coexisting networks, the fewer resources our algorithms use. When eight networks coexist, our algorithms outperform existing ones by consuming up to 63% fewer channel resources.
Language英语
WOS HeadingsScience & Technology ; Technology
WOS SubjectAutomation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS KeywordMESH NETWORKS ; TIME ; SCHEME ; GRAPH
WOS Research AreaAutomation & Control Systems ; Engineering ; Instruments & Instrumentation
Citation statistics
Cited Times:13[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/20224
Collection工业控制网络与系统研究室
Corresponding AuthorZeng P(曾鹏)
Affiliation1.Laboratory of Networked Control Systems, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.Department of Computer and Information Science, University of Pennsylvania, Philadelphia, PA, 19104, United States
3.Department of Computer Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
4.Department of Informatics, Technical University of Dortmund, Dortmund, 44227, Germany
Recommended Citation
GB/T 7714
Jin X,Kong FX,Kong LH,et al. Reliability and Temporality Optimization for Multiple Coexisting WirelessHART Networks in Industrial Environments[J]. IEEE Transactions on Industrial Electronics,2017,64(8):6591-6602.
APA Jin X,Kong FX,Kong LH,Liu, W,&Zeng P.(2017).Reliability and Temporality Optimization for Multiple Coexisting WirelessHART Networks in Industrial Environments.IEEE Transactions on Industrial Electronics,64(8),6591-6602.
MLA Jin X,et al."Reliability and Temporality Optimization for Multiple Coexisting WirelessHART Networks in Industrial Environments".IEEE Transactions on Industrial Electronics 64.8(2017):6591-6602.
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