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Non-uniformity calibration for MWIR polarization imagery obtained with integrated microgrid polarimeters
Liu HZ(刘海峥); Shi ZL(史泽林); Feng B(冯斌); Hui B(惠斌); Zhao YH(赵耀宏)
Department光电信息技术研究室
Conference NameChinese Society for Optical Engineering Conferences, CSOE 2016
Conference DateNov. 2016
Conference PlaceJinhua, Suzhou, Chengdu, Xi'an, And Wuxi, China
Source PublicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Publication PlaceBellingham, WA
2016
Pages1-6
Indexed ByEI
EI Accession number20171403514695
Contribution Rank1
ISSN0277-786X
ISBN978-1-5106-1011-8
KeywordNon-uniformity Calibration Infrared Polarization Microgrid Polarimeter
AbstractIntegrating microgrid polarimeters on focal plane array (FPA) of an infrared detector causes non-uniformity of polarization response. In order to reduce the effect of polarization non-uniformity, this paper constructs an experimental setup for capturing raw flat-field images and proposes a procedure for acquiring non-uniform calibration (NUC) matrix and calibrating raw polarization images. The proposed procedure takes the incident radiation as a polarization vector and offers a calibration matrix for each pixel. Both our matrix calibration and two-point calibration are applied to our mid-wavelength infrared (MWIR) polarization imaging system with integrated microgrid polarimeters. Compared with two point calibration, our matrix calibration reduces non-uniformity by 30-40% under condition of flat-field data test with polarization. The ourdoor scene observation experiment indicates that our calibration can effectively reduce polarization non-uniformity and improve the image quality of our MWIR polarization imaging system.
Language英语
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/20285
Collection光电信息技术研究室
Corresponding AuthorLiu HZ(刘海峥)
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China
2.Key Laboratory of Optical-Electronics Information Processing, Chinese Academy of Sciences, Shenyang, 110016, China
3.University of Chinese Academy of Sciences, Beijing, 100049, China
4.School of Optoelectronic Engineering, Xi'An Technological University, Xi'an, 710032, China
Recommended Citation
GB/T 7714
Liu HZ,Shi ZL,Feng B,et al. Non-uniformity calibration for MWIR polarization imagery obtained with integrated microgrid polarimeters[C]. Bellingham, WA:SPIE,2016:1-6.
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