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A contour extraction algorithm based on wavelet transform and dynamic contour compensation
Mu BY(穆宝岩); Chen S(陈帅); Ma Y(马钺)
Department智能检测与装备研究室
Conference Name2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS)
Conference DateDecember 2-4, 2016
Conference PlaceXi'an, CHINA
Source PublicationPROCEEDINGS OF THE 2ND ANNUAL INTERNATIONAL CONFERENCE ON ELECTRONICS, ELECTRICAL ENGINEERING AND INFORMATION SCIENCE (EEEIS 2016)
PublisherATLANTIS PRESS
Publication PlacePARIS
2016
Pages109-115
Indexed ByCPCI(ISTP)
WOS IDWOS:000400862900014
Contribution Rank1
ISSN2352-5401
ISBN978-94-6252-320-3
KeywordEdge Detection Wavelet Transform Contour Compensation
AbstractContour extraction process is often disturbed by complex backgrounds or foregrounds in the machine vision system. A new contour extraction algorithm is proposed based on wavelet transform and dynamic contour compensation. The wavelet transform method is used to extract the edge of image, and the dynamic compensation is used to restore the contour which is affected by the complex dark areas such as bar code or black icon. The algorithm is applied in a sausage machine vision inspection system, and it is proved effective in eliminating the contour depression and retaining the actual defect features.
Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/20491
Collection智能检测与装备研究室
Corresponding AuthorMu BY(穆宝岩)
AffiliationShenyang Institute of Automation Chinese Academy of Sciences, Shenyang, Liaoning, China
Recommended Citation
GB/T 7714
Mu BY,Chen S,Ma Y. A contour extraction algorithm based on wavelet transform and dynamic contour compensation[C]. PARIS:ATLANTIS PRESS,2016:109-115.
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