Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis | |
Zhou PL(周培林)![]() ![]() ![]() ![]() ![]() | |
Department | 机器人学研究室 |
Source Publication | ACS Applied Materials and Interfaces
![]() |
ISSN | 1944-8244 |
2017 | |
Volume | 9Issue:19Pages:16715-16724 |
Indexed By | SCI ; EI |
EI Accession number | 20172203700933 |
WOS ID | WOS:000401782500088 |
Contribution Rank | 1 |
Funding Organization | National Natural Science Foundation of China (project no. 61475183, 61503258 and U1613220), the CAS FEA International Partnership Program for Creative Research Teams, and the Youth Innovation Promotion Association CAS. |
Keyword | Afm Tip-induced Dep 3d Nanomanipulation Nanoassembly Nanostructure |
Abstract | In this article, we present a novel method of spatial manipulation and assembly of nanoparticles via atomic force microscopy tip-induced dielectrophoresis (AFM-DEP). This method combines the high-accuracy positioning of AFM with the parallel manipulation of DEP. A spatially nonuniform electric field is induced by applying an alternating current (AC) voltage between the conductive AFM probe and an indium tin oxide glass substrate. The AFM probe acted as a movable DEP tweezer for nanomanipulation and assembly of nanoparticles. The mechanism of AFM-DEP was analyzed by numerical simulation. The effects of solution depth, gap distance, AC voltage, solution concentration, and duration time were experimentally studied and optimized. Arrays of 200 nm polystyrene nanoparticles were assembled into various nanostructures, including lines, ellipsoids, and arrays of dots. The sizes and shapes of the assembled structures were controllable. It was thus demonstrated that AFM-DEP is a flexible and powerful tool for nanomanipulation. |
Language | 英语 |
WOS Headings | Science & Technology ; Technology |
WOS Subject | Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary |
WOS Keyword | NANOFIBER NANOELECTRODE ARRAYS ; ENHANCED RAMAN-SPECTROSCOPY ; CARBON NANOTUBES ; NANOMANIPULATION ; AFM ; TWEEZERS ; BACTERIA ; PROBE ; DNA ; SIMULATION |
WOS Research Area | Science & Technology - Other Topics ; Materials Science |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.sia.cn/handle/173321/20496 |
Collection | 机器人学研究室 |
Corresponding Author | Yu HB(于海波); Liu LQ(刘连庆) |
Affiliation | 1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China 2.University of Chinese Academy of Sciences, Beijing 100049, China 3.Beijing Advanced Innovation Center for Imaging Technology, Capital Normal University, Beijing, 100048, China 4.Department of Advanced Robotics, Chiba Institute of Technology, Chiba, 275-0016, Japan 5.Department of Mechanical and Biomedical Engineering, City University of Hong Kong, Kowloon Tong, Hong Kong |
Recommended Citation GB/T 7714 | Zhou PL,Yu HB,Yang WG,et al. Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis[J]. ACS Applied Materials and Interfaces,2017,9(19):16715-16724. |
APA | Zhou PL.,Yu HB.,Yang WG.,Wen YD.,Wang ZD.,...&Liu LQ.(2017).Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis.ACS Applied Materials and Interfaces,9(19),16715-16724. |
MLA | Zhou PL,et al."Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis".ACS Applied Materials and Interfaces 9.19(2017):16715-16724. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Spatial Manipulation(755KB) | 期刊论文 | 作者接受稿 | 开放获取 | ODC PDDL | View Application Full Text |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment