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Alternative TitleAdaptive control based on current-error compensation model for SICM
滕泽宇; 于鹏; 杨洋; 杨铁; 刘连庆
Source Publication仪器仪表学报
Indexed ByEI ; CSCD
EI Accession number20174804460088
Contribution Rank1
Funding Organization国家自然科学基金面上项目(61573341) ; 国家自然科学基金专项(61327014) ; 国家自然科学基金重点项目(61433017)资助
Keyword扫描离子电导显微镜 拖尾现象 自适应控制 补偿模型 先验知识
Other AbstractScanning ion conductance microscopy (SICM) can be used to obtain the surface topography of the sample under non-contact conditions. It can realize the nondestructive imaging of soft samples, e. g. , living cells in physiological liquid environment. However, there is smearing phenomenon in the SICM image when using the continuous feedback-control scanning mode which is found through a large number of experimental results. It causes the image distortion and limits the scan speed. To solve this problem, the SICM imaging principle is analyzed. It is concluded that the highly nonlinearity of the approach curve is the main reason for this phenomenon, and an adaptive control method based on current-error compensation model for SICM is proposed in this study. The main idea is to establish a current-error compensation model, predict the current scanning point position by using the scanning data of the last line as the prior knowledge, and then put it into the compensation model to calculate the new current-error as the system controlled variable. Finally, the performance of scan images for the standard grating under the new and old control algorithms is compared. The experimental results show that the new algorithm can effectively solve the smearing phenomenon at a certain degree of scanning speed and significantly reduce the image distortion. It provides an effective technical method to improve the image quality and imaging speed of SICM system.
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Document Type期刊论文
Corresponding Author刘连庆
Recommended Citation
GB/T 7714
滕泽宇,于鹏,杨洋,等. 基于电流偏差补偿模型的SICM自适应控制[J]. 仪器仪表学报,2017,38(9):2258-2265.
APA 滕泽宇,于鹏,杨洋,杨铁,&刘连庆.(2017).基于电流偏差补偿模型的SICM自适应控制.仪器仪表学报,38(9),2258-2265.
MLA 滕泽宇,et al."基于电流偏差补偿模型的SICM自适应控制".仪器仪表学报 38.9(2017):2258-2265.
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