SIA OpenIR  > 工业控制网络与系统研究室
Fault analysis and fault diagnosis method review on active distribution network
Zhang, Tong; Liu, Jianchang; Sun LX(孙兰香); Yu HB(于海斌)
Department工业控制网络与系统研究室
Conference Name2nd International Conference on Intelligent and Interactive Systems and Applications, IISA 2017
Conference DateJune 17-18, 2017
Conference PlaceBeijing, China
Source PublicationAdvances in Intelligent Systems and Computing
PublisherSpringer Verlag
Publication PlaceBerlin
2017
Pages628-633
Indexed ByEI
EI Accession number20174604400099
Contribution Rank2
ISSN2194-5357
ISBN978-3-319-69095-7
KeywordActive Distribution Network (Adn) Fault Analysis Fault Diagnosis
AbstractThis paper analyses the current situation and researches the fault cause and the common fault type in active distribution network (ADN). The fault diagnosis methods are summarized and the advantage of the common methods are compared. The general problems consist in the current fault diagnosis methods of ADN are researched in this paper. Combining the development trend of ADN and the power supply reliability demand, the further research direction of ADN fault diagnosis method is proposed, which lays the foundation of the AND self healing and protection control.
Language英语
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/21234
Collection工业控制网络与系统研究室
Corresponding AuthorZhang, Tong
Affiliation1.Department of Automation, College of Information Science and Engineering, Northeastern University, Shenyang, 110819, China
2.Key Laboratory of Industrial Control Network, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China
Recommended Citation
GB/T 7714
Zhang, Tong,Liu, Jianchang,Sun LX,et al. Fault analysis and fault diagnosis method review on active distribution network[C]. Berlin:Springer Verlag,2017:628-633.
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