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An Ontology Modeling and Application for an Assembly Line of Manufacturing System
Xue LL(薛玲玲); Wang P(王鹏); Cheng HB(程海波); Tong X(佟星); Zeng P(曾鹏); Yu HB(于海斌)
作者部门工业控制网络与系统研究室
会议名称IECON 2017: 43rd Annual Conference of the IEEE Industrial Electronics Society (IES)
会议日期October 29 - November 1, 2017
会议地点Beijing, China
会议主办者IEEE Industrial Electronics Society
会议录名称Proceedings of the 43rd Annual Conference of the IEEE Industrial Electronics Society (IECON 2017)
出版者IEEE
出版地New York
2017
页码5414-5419
收录类别EI ; CPCI(ISTP)
EI收录号20182005186720
WOS记录号WOS:000427164805058
产权排序1
ISSN号1553-572X
ISBN号978-1-5386-1127-2
关键词Assembly Line Ontology Module Semantic Technology
摘要

The increasing new product variants force the manufacturing enterprise to take a short time in adjusting the automatic assembly line rapidly. but it seems a challenging task. Realizing integration of information technology and manufacturing technology is the very essence of new manufacturing schema. The paper introduces an ontology-based modeling and application method to test the feasibility of manufacturing system. This work uses the SPARQL query and update technology to reflect the accurate entities' slate and obtain device information. The predefined rules arc used to build the corresponding rule repository according to the practical product process and knowledge base. A reasoning engine is utilized to Infer facts about the assembling environment from the formalized knowledge model and decide whether the current environment can support the given assembling requirements. The result shows the ontology technology is useful for the assembly line of manufacturing system.

语种英语
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文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/21324
专题工业控制网络与系统研究室
通讯作者Xue LL(薛玲玲)
作者单位1.Lab. of Networked Control Systems, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.University of Chinese Academy of Sciences, Beijing 100049, China
推荐引用方式
GB/T 7714
Xue LL,Wang P,Cheng HB,et al. An Ontology Modeling and Application for an Assembly Line of Manufacturing System[C]//IEEE Industrial Electronics Society. New York:IEEE,2017:5414-5419.
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