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Robust Measurement of Specular Surfaces with One Shot Projection and Pattern Registration
Wang ZZ(王振洲)
作者部门机器人学研究室
会议名称2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
会议日期July 31 - Augest 4, 2017
会议地点Singapore, SINGAPORE
会议录名称2017 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR)
出版者IEEE
出版地New York
2017
页码1-5
收录类别EI ; CPCI(ISTP)
EI收录号20181304942119
WOS记录号WOS:000417416900001
产权排序1
ISBN号978-1-5090-6290-4
关键词Structured Light Specular Surfaces Analytical Solution Pattern Registration Degree Of Freedom
摘要Measuring specular surfaces is of importance in both scientific and industrial applications. In this paper, we present a structured light method to measure the shapes of specular surfaces with one-shot projection. This method projects a pattern of laser rays onto the specular surface. By intercepting the reflection of a projected laser pattern twice, two points of each reflected ray are obtained. Then each reflected ray is determined with an analytical solution. Further, the interception points of the projected pattern on the specular surface are obtained with the analytical solutions of the intersections between the incident rays and the reflected rays. Due to the smoothness of the specular surface, the finer surface with higher resolution can thus be reconstructed by polynomial interpolation based on these reconstructed points. To increase the measurement accuracy, we propose a pattern registration method to eliminate the noise and radial lens distortion by decreasing the degree of freedom of the projected rays to one during system calibration. Experimental results showed that this structured light method with pattern registration could achieve the femtometre measurement accuracy.
语种英语
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文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/21479
专题机器人学研究室
通讯作者Wang ZZ(王振洲)
作者单位State key lab of robotics, Shenyang institute of automation, Chinese academy of sciences, Shenyang, 110016, China
推荐引用方式
GB/T 7714
Wang ZZ. Robust Measurement of Specular Surfaces with One Shot Projection and Pattern Registration[C]. New York:IEEE,2017:1-5.
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