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Robust Measurement of Specular Surfaces with One Shot Projection and Pattern Registration
Wang ZZ(王振洲)
Conference Name2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
Conference DateJuly 31 - Augest 4, 2017
Conference PlaceSingapore, SINGAPORE
Publication PlaceNew York
Indexed ByEI ; CPCI(ISTP)
EI Accession number20190206352401
WOS IDWOS:000417416900001
Contribution Rank1
KeywordStructured Light Specular Surfaces Analytical Solution Pattern Registration Degree Of Freedom
AbstractMeasuring specular surfaces is of importance in both scientific and industrial applications. In this paper, we present a structured light method to measure the shapes of specular surfaces with one-shot projection. This method projects a pattern of laser rays onto the specular surface. By intercepting the reflection of a projected laser pattern twice, two points of each reflected ray are obtained. Then each reflected ray is determined with an analytical solution. Further, the interception points of the projected pattern on the specular surface are obtained with the analytical solutions of the intersections between the incident rays and the reflected rays. Due to the smoothness of the specular surface, the finer surface with higher resolution can thus be reconstructed by polynomial interpolation based on these reconstructed points. To increase the measurement accuracy, we propose a pattern registration method to eliminate the noise and radial lens distortion by decreasing the degree of freedom of the projected rays to one during system calibration. Experimental results showed that this structured light method with pattern registration could achieve the femtometre measurement accuracy.
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Document Type会议论文
Corresponding AuthorWang ZZ(王振洲)
AffiliationState key lab of robotics, Shenyang institute of automation, Chinese academy of sciences, Shenyang, 110016, China
Recommended Citation
GB/T 7714
Wang ZZ. Robust Measurement of Specular Surfaces with One Shot Projection and Pattern Registration[C]. New York:IEEE,2017:1-5.
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