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Noise Analysis and Optimization of a Unity Gain Sampler
Wang X(王霄); Shi ZL(史泽林); Zhao YH(赵耀宏); Qiao J(乔俊)
作者部门光电信息技术研究室
会议名称2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)
会议日期November 8-11, 2017
会议地点Nanjing, CHINA
会议录名称2017 2ND IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUITS AND MICROSYSTEMS (ICICM)
出版者IEEE
出版地NEW YORK
2017
页码78-81
收录类别EI ; CPCI(ISTP)
EI收录号20183205656153
WOS记录号WOS:000425209500017
产权排序1
ISBN号978-1-5386-3506-3
关键词Unity Gain Sampler Noise Model Thermal Noise Correlated Double Sampling Time Domain Noise Simulation
摘要

Noise analysis of a widely used switched capacitor unity gain sampler is presented, which in detail shows that the circuit structure can not only get rid of the offset voltage induced by the OTA involved, but also has the ability of suppressing 1/f noise with operation timing of the sampling capacitor, functioning as correlated double sampling in fact, however paying the price of increasing thermal noise. The noise analysis method starts from establishing noise model for the sampler in each individual clock phase. Then based on the characteristic of charge transferring by capacitors and theory of random process, the output noise power contributed by each noise source is derived, the key point of which is that how to determine whether the process of some noise source in some phase transferring to the output node is effected by filtering. At last optimization design for the capacitor elements, which determine the whole noise power, is conducted.

语种英语
引用统计
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/21557
专题光电信息技术研究室
通讯作者Wang X(王霄)
作者单位1.Shenyang Institute of Automation, Chinese Academy of Sciences
2.Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang 110016, China
推荐引用方式
GB/T 7714
Wang X,Shi ZL,Zhao YH,et al. Noise Analysis and Optimization of a Unity Gain Sampler[C]. NEW YORK:IEEE,2017:78-81.
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