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Optimization design for a CDS circuit with offset canceling
Wang X(王霄); Shi ZL(史泽林); Zhao YH(赵耀宏); Qiao J(乔俊)
作者部门光电信息技术研究室
会议名称13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017
会议日期October 18-20, 2017
会议地点Hsinchu, Taiwan
会议主办者IEEE Electron Devices Society (EDS); IEEE Taipei Section CAS Chapter; IEEE Taipei Section ED Chapter; IEEE Taipei Section SSC Chapter; Ministry of Science and Technology
会议录名称EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
出版者IEEE
出版地NEW YORK
2017
页码1-4
收录类别EI ; CPCI(ISTP)
EI收录号20181104903410
WOS记录号WOS:000426985900075
产权排序1
ISBN号978-1-5386-2907-9
关键词Correlated Double Sampling(Cds) Noise Source Optimization Method Noise Model
摘要Correlated double sampling(CDS) operation is generally used in CMOS imaging systems, implemented by switched capacitor(SC) circuits, to get rid of reset noise and decrease flicker noise. This paper presents an optimization method for the noise performance of a CDS circuit, the advantage of which is its ability of canceling the offset of the OP involved. The structure of the CDS circuit is analyzed with operation timing at first. Then the noise model of each individual clock phase is established based on the transient noise behavior, from which we derive the expressions of each independent noise source contributing to the whole output noise power. Using the expressions we can optimize the design of crucial capacitors of the circuit.
语种英语
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文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/21558
专题光电信息技术研究室
通讯作者Wang X(王霄)
作者单位Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
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Wang X,Shi ZL,Zhao YH,et al. Optimization design for a CDS circuit with offset canceling[C]//IEEE Electron Devices Society (EDS); IEEE Taipei Section CAS Chapter; IEEE Taipei Section ED Chapter; IEEE Taipei Section SSC Chapter; Ministry of Science and Technology. NEW YORK:IEEE,2017:1-4.
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