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题名:
A review of nanoscale characterizing individual DNA behaviors using atomic force microscopy
作者: Li M(李密); Dang D(党丹); Xi N(席宁); Wang YC(王越超); Liu LQ(刘连庆)
作者部门: 机器人学研究室
通讯作者: Li M(李密) ; Liu LQ(刘连庆)
关键词: —atomic force microscopy, nanoscale, DNA topography, DNA mechanics, DNA origami, nanorobotics
刊名: IEEE Transactions on Nanotechnology
ISSN号: 1536-125X
出版日期: 2018
收录类别: EI
EI收录号: 20181404982776
产权排序: 1
项目资助者: National Natural Science Foundation of China (61503372, 61522312, U1613220, 61433017, 61504072), the Youth Innovation Promotion Association CAS (No. 2017243) and CAS FEA International Partnership Program for Creative Research Teams
摘要: DNA, the structural basis of genetic, plays a crucial role in the life of cells. The abnormal behaviors of DNA are closely related to the pathological changes of living organisms. The advent of atomic force microscopy (AFM) provides an exciting instrument for biophysically probing the nanoscale dynamic activities of individual native molecules, considerably complementing the results obtained by traditional biochemical population-averaged measurements. In the past decades, AFM has been widely used in DNA studies, significantly providing novel insights into molecular biology. In this article, the methodologies and progresses of utilizing AFM to characterize the behaviors of individual DNA molecules from several facets (including DNA topography imaging, DNA mechanics measurements, DNA origami, and DNA nanorobotics) are reviewed, and the future directions are discussed.
语种: 英语
内容类型: 期刊论文
URI标识: http://ir.sia.cn/handle/173321/21730
Appears in Collections:机器人学研究室_期刊论文

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作者单位: 1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Shenyang 110016, China
2.School of Medical Devices, Shenyang Pharmaceutical University, Shenyang 110016, China
3.Department of Industrial and Manufacturing Systems Engineering, The University of Hong Kong, Hong Kong, China

Recommended Citation:
Li M,Dang D,Xi N,et al. A review of nanoscale characterizing individual DNA behaviors using atomic force microscopy[J]. IEEE Transactions on Nanotechnology,2018.
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