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Characteristics Analysis for Nanosoldering with Atomic Force Microscope
Liu ZL(刘增磊)1; Gao AL(高爱莲)2; Xie SX(解双喜)3; Jiao ND(焦念东)4; Liu LQ(刘连庆)4
Department机器人学研究室
Source PublicationNano
ISSN1793-2920
2018
Volume13Issue:4Pages:1-8
Indexed BySCI ; EI
EI Accession number20181605032372
WOS IDWOS:000431138000007
Contribution Rank4
Funding OrganizationNational Natural Science Foundation of China
KeywordField-emission deposition nanosoldering nanodevice nanofabrication
AbstractField-emission deposition of atomic force microscope (AFM) can be used to fabricate nanopads, and therefore has potential applications in soldering nanodevices. However, the soldering effects are hard to verify because the soldering pads are of nanoscale. This paper studied the electrical, thermal and mechanical characteristics of the deposited nanopads, in order to testify the soldering effects. For this purpose, first, a carbon nanotube field effect transistor (CNTFET) was soldered to see whether the conductivity of the transistor was improved. Next, the thermal performance of the nanopads were observed by heating them in an oven. Last, the nanopads were mechanically pushed by an AFM probe to test the physical connection between the nanopads and the substrate. Experimental results showed that the nanosoldering dramatically reduced the contact resistance of the transistor. Moreover, the nanopads could withstand high temperature and mechanical push. Consequently, field-emission deposition of the AFM promised a bright future in nanosoldering.
Language英语
WOS SubjectNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS Research AreaScience & Technology - Other Topics ; Materials Science ; Physics
Funding ProjectNational Natural Science Foundation of China[61504072]
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Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/21885
Collection机器人学研究室
Corresponding AuthorLiu ZL(刘增磊)
Affiliation1.School of Electronic and Electrical Engineering, Nanyang Institute of Technology, Nanyang 473004, P. R. China;
2.Information Construction and Network Center, Nanyang Institute of Technology, Nanyang 473004, P. R. China;
3.College of Electrical and Mechanical Engineering, Pingdingshan University, Pingdingshan 467000, P. R. China;
4.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, P. R. China
Recommended Citation
GB/T 7714
Liu ZL,Gao AL,Xie SX,et al. Characteristics Analysis for Nanosoldering with Atomic Force Microscope[J]. Nano,2018,13(4):1-8.
APA Liu ZL,Gao AL,Xie SX,Jiao ND,&Liu LQ.(2018).Characteristics Analysis for Nanosoldering with Atomic Force Microscope.Nano,13(4),1-8.
MLA Liu ZL,et al."Characteristics Analysis for Nanosoldering with Atomic Force Microscope".Nano 13.4(2018):1-8.
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