SIA OpenIR  > 工业控制网络与系统研究室
Key process protection of high dimensional process data in complex production
Shi H(石贺)1,2,3,4; Shang WL(尚文利)1,2,3,4; Chen CY(陈春雨)1,2,3,4; Zhao JM(赵剑明)1,2,3,4; Yin L(尹隆)1,2,3,4
Department工业控制网络与系统研究室
Source PublicationComputers, Materials and Continua
ISSN1546-2218
2019
Volume60Issue:2Pages:645-658
Indexed ByEI
EI Accession number20194707721287
Contribution Rank1
Funding OrganizationNational Natural Science Foundation of China, 2018.01-2020. 12 (No. 61773368) ; Strategic Priority Research Program of Chinese Academy of Sciences (Grant No. XDC02000000) ; State Grid Corp of China’s Science and Technology Project “Application of Edge Computing in Smart Grid and Security Protection Technology Research” (52110118001H).
KeywordIndustrial control system outlier detection anomaly detection system rule tree model
Abstract

In order to solve the problem of locating and protecting key processes and detecting outliers efficiently in complex industrial processes. An anomaly detection system which is based on the two-layer model fusion frame is designed in this paper. The key process is located by using the random forest model firstly, then the process data feature selection, dimension reduction and noise reduction are processed. Finally, the validity of the model is verified by simulation experiments. It is shown that this method can effectively reduce the prediction accuracy variance and improve the generalization ability of the traditional anomaly detection model from the experimental results.

Language英语
Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/25884
Collection工业控制网络与系统研究室
Corresponding AuthorShang WL(尚文利)
Affiliation1.University of Chinese academy of sciences, Beijing, China
2.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
3.Key Laboratory of Networked Control Systems, Chinese Academy of Sciences, Shenyang, China
4.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang, China
Recommended Citation
GB/T 7714
Shi H,Shang WL,Chen CY,et al. Key process protection of high dimensional process data in complex production[J]. Computers, Materials and Continua,2019,60(2):645-658.
APA Shi H,Shang WL,Chen CY,Zhao JM,&Yin L.(2019).Key process protection of high dimensional process data in complex production.Computers, Materials and Continua,60(2),645-658.
MLA Shi H,et al."Key process protection of high dimensional process data in complex production".Computers, Materials and Continua 60.2(2019):645-658.
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