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High Precision Loading Control Method for Sun-Tracking Unit Semi-physical Test System
Liu MY(刘明洋)1; Xu ZG(徐志刚)1; Zhao, Zhen2; Bai XL(白鑫林)1; Chen YL(陈月玲)1
Department智能产线与系统研究室
Conference Name15th IEEE International Conference on Control and Automation, ICCA 2019
Conference DateJuly 16-19, 2019
Conference PlaceEdinburgh, United kingdom
Source Publication2019 IEEE 15th International Conference on Control and Automation, ICCA 2019
PublisherIEEE Computer Society
Publication PlaceWashington
2019
Pages429-434
Indexed ByEI
EI Accession number20194907778989
Contribution Rank1
ISSN1948-3449
ISBN978-1-7281-1164-3
Keywordsun-tracking unit real-time system nonlinear tracking-differentiator semi-physical system
Abstractin this paper, a semi-physical ground test technology is proposed to simulate the disturbance of flexible solar panels on sun-tracking unit. In order to improve the precision of the semi-physical test, several methods have been designed. Firstly, semi-physical test platform with ultra-high stiffness and automatically adapted to motion errors without additional force is designed to provide foundation. Secondly, solar wing dynamic model is established and discrete by Wilson 6 method to calculate torque by real-time system. Thirdly, angular acceleration estimation of sun-tracking unit is obtained by nonlinear tracking-differentiator. Finally, simulation and experiment results show that platform can provide disturbance simulation torque, the platform can test the performance of sun-tracking unit. © 2019 IEEE.
Language英语
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/25952
Collection智能产线与系统研究室
Corresponding AuthorLiu MY(刘明洋)
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang 110016, China
2.Nanjing University of Aeronautics and Astronautics, State Key Lab of Mechanics and Control of Mechanical Structures, Nanjing 210016, China
Recommended Citation
GB/T 7714
Liu MY,Xu ZG,Zhao, Zhen,et al. High Precision Loading Control Method for Sun-Tracking Unit Semi-physical Test System[C]. Washington:IEEE Computer Society,2019:429-434.
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