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The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy
Wang W(汪为)1,2,3,4,5; Sun LX(孙兰香)1,2,3,5; Wang GD(王国栋)1,2,3,4,5; Zeng P(曾鹏)1,2,3,5; Qi LF(齐立峰)1,2,3,5; Zheng LM(郑黎明)1,2,3,5; Dong W(董伟)1,2,3,5
Department工业控制网络与系统研究室
Corresponding AuthorSun, Lanxiang(sunlanxiang@sia.cn)
Source PublicationJournal of Analytical Atomic Spectrometry
ISSN0267-9477
2020
Volume35Issue:2Pages:357-365
Indexed BySCI ; EI
EI Accession number20200808199960
WOS IDWOS:000514606000011
Contribution Rank1
Funding OrganizationNational Key Research and Development Program of China (2017YFF0106202) ; Key Research Program of Frontier Sciences, CAS (QYZDJ-SSWJSC037) ; LiaoNing Revitalization Talents Program (XLYC1807110) ; Youth Innovation Promotion Association, CAS
Abstract

In the microanalysis of laser-induced breakdown spectroscopy, the influence of surface roughness on spectral stability and quantitative analysis capability was studied for the first time when the laser ablation crater diameter was approximately 10 μm. By using a microchip laser, the spectra were acquired on a set of carbon steel samples, whose roughness changed from 0.0392 μm to 0.5248 μm. Besides, the study found that the surface roughness of the sample neglected the effect on spectral stability via screening and analyzing the spectral data when the sample stage moved at a constant speed. Moreover, when the spectral collection was performed with the ablation crater overlap rate of approximately 75% and Fe line was used as the internal standard, the effect of sample surface roughness on the quantitative analysis of the spectrum was negligible, and the resulting calculated determination coefficients of the Mn, Si, Ni, V, Cr, and Cu elements all exceeded 0.993.

Language英语
WOS SubjectChemistry, Analytical ; Spectroscopy
WOS KeywordFEMTOSECOND ; STEEL ; SPECTROMETRY ; PLASMA ; PICOSECOND ; TOPOGRAPHY ; ABLATION ; LIBS
WOS Research AreaChemistry ; Spectroscopy
Funding ProjectNational Key Research and Development Program of China[2017YFF0106202] ; Key Research Program of Frontier Sciences, CAS[QYZDJ-SSW-JSC037] ; LiaoNing Revitalization Talents Program[XLYC1807110] ; Youth Innovation Promotion Association, CAS
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Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/26307
Collection工业控制网络与系统研究室
Corresponding AuthorSun LX(孙兰香)
Affiliation1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.Key Laboratory of Networked Control System, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
3.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, China
4.University of Chinese Academy of Sciences, Beijing 100049, China
5.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
Recommended Citation
GB/T 7714
Wang W,Sun LX,Wang GD,et al. The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy[J]. Journal of Analytical Atomic Spectrometry,2020,35(2):357-365.
APA Wang W.,Sun LX.,Wang GD.,Zeng P.,Qi LF.,...&Dong W.(2020).The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy.Journal of Analytical Atomic Spectrometry,35(2),357-365.
MLA Wang W,et al."The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy".Journal of Analytical Atomic Spectrometry 35.2(2020):357-365.
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