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LSTM Based EFAST Global Sensitivity Analysis for Interwell Connectivity Evaluation Using Injection and Production Fluctuation Data
Cheng HB(程海波)1,2,3,4; Vyatkin, Valeriy5,6; Osipov, Evgeny5; Zeng P(曾鹏)1,2,3; Yu HB(于海斌)1,2,3
Department工业控制网络与系统研究室
Source PublicationIEEE ACCESS
ISSN2169-3536
2020
Volume8Pages:67289-67299
Indexed BySCI ; EI
EI Accession number20201808598528
WOS IDWOS:000527416200005
Contribution Rank1
Funding OrganizationNatural Science Foundation of ChinaNational Natural Science Foundation of China [61533015]
KeywordInterwell connectivity long short-term memory global sensitivity analysis extended Fourier amplitude sensitivity test oil and gas field
Language英语
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/26749
Collection工业控制网络与系统研究室
Corresponding AuthorYu HB(于海斌)
Affiliation1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.Key Laboratory of Networked Control Systems, Chinese Academy of Sciences, Shenyang 110016, China
3.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, China
4.University of Chinese Academy of Sciences, Beijing 100049, China
5.Department of Computer Science, Electrical and Space Engineering, Luleå University of Technology, 97187 Luleå, Sweden
6.Department of Electrical Engineering and Automation, Aalto University, 02150 Espoo, Finland
Recommended Citation
GB/T 7714
Cheng HB,Vyatkin, Valeriy,Osipov, Evgeny,et al. LSTM Based EFAST Global Sensitivity Analysis for Interwell Connectivity Evaluation Using Injection and Production Fluctuation Data[J]. IEEE ACCESS,2020,8:67289-67299.
APA Cheng HB,Vyatkin, Valeriy,Osipov, Evgeny,Zeng P,&Yu HB.(2020).LSTM Based EFAST Global Sensitivity Analysis for Interwell Connectivity Evaluation Using Injection and Production Fluctuation Data.IEEE ACCESS,8,67289-67299.
MLA Cheng HB,et al."LSTM Based EFAST Global Sensitivity Analysis for Interwell Connectivity Evaluation Using Injection and Production Fluctuation Data".IEEE ACCESS 8(2020):67289-67299.
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