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Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations
Liu LQ(刘连庆); Yilun Luo; Xi N(席宁); Wang YC(王越超); Zhang JB(张江波); Li GY(李广勇)
Department机器人学研究室
Source PublicationIEEE/ASME Transactions on Mechatronics
ISSN1083-4435
2008
Volume13Issue:1Pages:76-85
Indexed BySCI ; EI
EI Accession number20081411182683
WOS IDWOS:000253840800009
Contribution Rank1
KeywordAtomic Force Microscopy (Afm) Fault Detection Local Scan Nanomanipulation
AbstractThe main problem of atomic force microscopy (AFM)-based nanomanipulation is the lack of real-time visual feedback. Although this problem has been partially solved by virtual reality technology, the faulty display caused by random drift and modeling errors in the virtual reality interface are still limiting the efficiency of the AFM-based nanomanipulation. Random drift aroused from an uncontrolled manipulation environment generates a position error between the manipulation coordinate and the true environment. Modeling errors due to the uncertainties of the nanoenvironment often result in displaying a wrong position of the object. Since there is no feedback to check the validity of the display, the faulty display cannot be detected in real time and leads to a failed manipulation. In this paper, a real-time fault detection and correction (RFDC) method is proposed to solve these problems by using the AFM tip as an end effector as well as a force sensor during manipulation. Based on the interaction force measured from the AFM tip, the validity of the visual feedback is monitored in real time by the developed Kalman filter. Once the faulty display is detected, it can be corrected online through a quick local scan without interrupting manipulation. In this way, the visual feedback keeps consistent with the true environment changes during manipulation, which makes it possible for several operations to finish without an image scan in between. The theoretical study and the implementation of the RFDC method are elaborated. Experiments of manipulating nanomaterials including nanoparticles and nanorods have been carried out to demonstrate its effectiveness and efficiency.
Language英语
WOS HeadingsScience & Technology ; Technology
WOS SubjectAutomation & Control Systems ; Engineering, Manufacturing ; Engineering, Electrical & Electronic ; Engineering, Mechanical
WOS KeywordSCANNING PROBE MICROSCOPES ; CONTROLLED MANIPULATION ; NANOPARTICLES ; DRIFT ; SAMPLES
WOS Research AreaAutomation & Control Systems ; Engineering
Citation statistics
Cited Times:44[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sia.cn/handle/173321/7405
Collection机器人学研究室
Corresponding AuthorLiu LQ(刘连庆)
Affiliation1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, Liaoning Province 110016, China
2.Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48823, United States
3.Chinese Academy of Sciences, Beijing 100001, China
4.Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15621, United States
Recommended Citation
GB/T 7714
Liu LQ,Yilun Luo,Xi N,et al. Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations[J]. IEEE/ASME Transactions on Mechatronics,2008,13(1):76-85.
APA Liu LQ,Yilun Luo,Xi N,Wang YC,Zhang JB,&Li GY.(2008).Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations.IEEE/ASME Transactions on Mechatronics,13(1),76-85.
MLA Liu LQ,et al."Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations".IEEE/ASME Transactions on Mechatronics 13.1(2008):76-85.
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